Effect of constrained growth on defect structures in microgravity grown CdZnTe boules

Raghothamachar, Balaji; Chung, Hua; Dudley, Michael; Larson, David J.

doi:10.1007/s11664-998-0015-5

Cited by 28 publications

(4 citation statements)

References 24 publications

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“…7,8 The dislocations produce a strain field in the surrounding regions, consequently leading to an enhanced intensity compared with the rest of the crystal. 9 Accordingly, diffraction contrast is generated, revealing the dislocations and strained regions inside the crystal. The presence of the cell-like structures signifies that the dislocations propagate and connect with each other in these localized regions.…”

Section: Resultsmentioning

confidence: 99%

Investigation of Cadmium Manganese Telluride Crystals for Room-Temperature Radiation Detection

Yang

Bolotnikov

Li³

et al. 2010

Journal of Elec Materi

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Cadmium manganese telluride (CMT) has high potential as a material for room-temperature nuclear-radiation detectors. We investigated indium-doped CMT crystals taken from the stable growth region of the ingot and compared its characteristics with that from the last-to-freeze region. We employed different techniques, including synchrotron white-beam x-ray topography (SWBXT), current-voltage (I-V) measurement, and low-temperature photoluminescence spectra, and we also assessed their responses as detectors of radiation exposure. The crystal from the stable growth region proved to be superior to that from the last-to-freeze region; it is a single-grain crystal, free of twins, and displayed a resistivity higher by one order of magnitude. The segregation of indium dopant in the ingot might be responsible for its better resistivity. Furthermore, we recorded a good response in the detector fabricated from the crystal taken from the stable growth region; its (ls) e value was 2.6 9 10 À3 cm 2 /V, which is acceptable for thin detectors, including their application in medicine.

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Section: Resultsmentioning

confidence: 99%

Investigation of Cadmium Manganese Telluride Crystals for Room-Temperature Radiation Detection

Yang

Bolotnikov

Li³

et al. 2010

Journal of Elec Materi

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“…Significant lowering of the dislocation density was registered in the area of contact-free crystal growth. Synchrotron X-ray topography characterization of CdZnTe boules grown on US Space Shuttle mission USML-1 (Raghothamachar et al, 1998) and of CdTe crystals grown in microgravity during the STS-95 mission (Fiederle et al, 2004) demonstrated the existence of dewetting areas of the crystals and their improved quality compared with the Earth-grown reference sample. These results clearly verify that contact with the ampoule wall plays an important role in the incidence of crystal imperfections.…”

Section: Introductionmentioning

confidence: 99%

Application of X-ray topography to USSR and Russian space materials science

Shul’pina

Прохоров

Serebryakov

et al. 2016

Int Union Crystallogr J

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The authors' experience of the application of X-ray diffraction imaging in carrying out space technological experiments on semiconductor crystal growth for the former USSR and for Russia is reported, from the Apollo-Soyuz programme (1975) up to the present day. X-ray topography was applied to examine defects in crystals in order to obtain information on the crystallization conditions and also on their changes under the influence of factors of orbital flight in space vehicles. The data obtained have promoted a deeper understanding of the conditions and mechanisms of crystallization under both microgravity and terrestrial conditions, and have enabled the elaboration of terrestrial methods of highly perfect crystal growth. The use of X-ray topography in space materials science has enriched its methods in the field of digital image processing of growth striations and expanded its possibilities in investigating the inhomogeneity of crystals.

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“…Cd 1-x Zn x Te (x = 0.04) nearly lattice matches with Hg 1-y Cd y Te (MCT) for all values of y, so it is mainly used as a substrate material for the epitaxial growth of MCT infrared focal plane arrays (IRFPAs). The main advantages of the Cd 0.96 Zn 0.04 Te are its infrared transparency, which allows backside illumination of the MCT infrared detector arrays (KENNEDY et al 1990;RAGOTHAMACHAR et al 1998). Recently Cd 1-x Zn x Te (x = 0.04) is used as the surface passivation layer for MCT infrared detectors (LEE et al 1997;LEE et al 1998).…”

Section: Introductionmentioning

confidence: 99%

Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry

Sridharan

Narayandass

Mangalaraj

et al. 2002

Cryst. Res. Technol.

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Cd0.96Zn0.04Te thin films are deposited onto well cleaned glass substrates (Corning 7059) kept at room temperature by vacuum evaporation and the films are annealed at 423 K. Rutherford Backscattering Spectrometry and X‐ray diffraction techniques are used to determine the thickness, composition and crystalline structure and grain size of the films respectively. The films exhibited zinc blende structure with predominant (111) orientation. The surface morphology of the films is studied by Atomic Force Microscopy. The rms roughness of the as‐deposited films is 3.7 nm and on annealing the films at 423K, the rms roughness value decreases to 3.4 nm. The Raman spectra of the Cd0.96Zn0.04Te films are recorded at room temperature to study lattice vibrations and their interactions with other excitations. The intensity of the peak increases and the FWHM decreases on annealing the films. The pseudodielectric‐function spectra, ε(E) = ε1(E) + i ε2(E), of polycrystalline Cd0.96Zn0.04Te thin films in the 1.3 ‐ 5.5eV photon energy range at room temperature are measured by spectroscopic ellipsometry. The measured dielectric function spectra reveal distinct structures at energies of the E1, E1+Δ1 and E2 critical points are due to interband transitions.

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Effect of constrained growth on defect structures in microgravity grown CdZnTe boules

Cited by 28 publications

References 24 publications

Investigation of Cadmium Manganese Telluride Crystals for Room-Temperature Radiation Detection

Investigation of Cadmium Manganese Telluride Crystals for Room-Temperature Radiation Detection

Application of X-ray topography to USSR and Russian space materials science

Characterization of Vacuum Evaporated Polycrystalline Cd0.96Zn0.04Te Thin Films by XRD, Raman Scattering and Spectroscopic Ellipsometry

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