2004
DOI: 10.1143/jjap.43.l1546
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Effect of Atomic Hydrogen on Preparation of Highly Moisture-Resistive SiNxFilms at Low Substrate Temperatures

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Cited by 13 publications
(10 citation statements)
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“…Similar results have been obtained in SiH 4 /C 2 H 2 /H 2 mixed systems 22. The properties of SiN x films can be improved by the addition of H 2 to SiH 4 /NH 3 mixtures 23–27. The etching rate of the deposited films decreases while the breakdown electric field increases.…”
Section: Importance Of H Atoms In Cvd Processessupporting
confidence: 81%
“…Similar results have been obtained in SiH 4 /C 2 H 2 /H 2 mixed systems 22. The properties of SiN x films can be improved by the addition of H 2 to SiH 4 /NH 3 mixtures 23–27. The etching rate of the deposited films decreases while the breakdown electric field increases.…”
Section: Importance Of H Atoms In Cvd Processessupporting
confidence: 81%
“…Hydride content is mainly determined by the amount of atomic hydrogen in the gas phase in low-temperature CVD processes, such as Cat-CVD. 13) In contrast, this hydride content depends on thermal desorption rate in thermal CVD. In this case, due to high substrate temperatures, H 2 desorption takes place not only on surfaces but also from the inside.…”
Section: Discussionmentioning
confidence: 99%
“…In Cat-CVD processes, source gas molecules are decomposed by catalytic cracking reactions on a heated catalyzer placed near the substrate [2]. So far, highly moisture-resistive SiN x films on Si substrates have been obtained at substrate temperatures between 20 and 100°C using a mixture of SiH 4 , NH 3 and H 2 as a source material [3][4][5]. The stress of SiN x films on Si substrates can be controlled from compressive to tensile by changing the deposition conditions and the stress is, in general, lower than 100 MPa [6].…”
Section: Introductionmentioning
confidence: 99%
“…The flow rate of SiH 4 , NH3 and H 2 was 10, 10 and 30 sccm, respectively. The substrate temperature was 65°C.…”
mentioning
confidence: 99%