Dynamics and Control of Tapping Tip in Atomic Force Microscope for Surface Measurement Applications

Lee, S.I.; Lee, J.M.; Hong, Seokyeon

doi:10.1016/s0007-8506(07)60161-9

Cited by 5 publications

(2 citation statements)

References 8 publications

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“…Characterizing the tip enables minimization of the tip shape "footprints" in sub-nanoresolution scans. Moreover, the AFM imaging accuracy described the nonlinear tip-surface interactions occurring in tapping mode [73]. This nonlinear phenomenon is especially prominent on high-adhesion surfaces, such as polymers and biomolecules.…”

Section: Geometry Of Cantilevers and Tipsmentioning

confidence: 99%

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

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In this paper, we provide a systematic review of atomic force microscopy (AFM), a fast-developing technique that embraces scanners, controllers, and cantilevers. The main objectives of this review are to analyze the available technical solutions of AFM, including the limitations and problems. The main questions the review addresses are the problems of working in contact, noncontact, and tapping AFM modes. We do not include applications of AFM but rather the design of different parts and operation modes. Since the main part of AFM is the cantilever, we focused on its operation and design. Information from scientific articles published over the last 5 years is provided. Many articles in this period disclose minor amendments in the mechanical system but suggest innovative AFM control and imaging algorithms. Some of them are based on artificial intelligence. During operation, control of cantilever dynamic characteristics can be achieved by magnetic field, electrostatic, or aerodynamic forces.

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Section: Geometry Of Cantilevers and Tipsmentioning

confidence: 99%

Characteristics and Functionality of Cantilevers and Scanners in Atomic Force Microscopy

Dzedzickis,

Rožėnė,

Bučinskas

et al. 2023

Materials

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“…The typical probe profilometer such as stylus method [1] or similar devices [2] are commonly used. Most probes used in contact mode instruments were made of tungsten or single-crystal diamond.…”

Section: Introductionmentioning

confidence: 99%

Application of High Aspect Ratio Scanning Probe in Microstructure Measurement

Guo

Chen

et al. 2009

AMR

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An experiment, which is based on a self-developed pure tungsten high aspect ratio scanning probe, was conducted to measure the topography of a micro channel and a complex microstructure respectively. Comparison and analysis of both results by the tungsten probe and a single-crystal diamond probe were carried out. It indicates that the newly developed pure tungsten scanning probe has the capability in topography measurement, particularly fit for the high aspect ratio surface measurement.

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