Dynamic properties of AFM cantilevers and the calibration of their spring constants

Mendels, D. A.; Löwe, M.; Cuenat, Alexandre; Cain, Markys G.; Vallejo, Elena; Ellis, David I.; Mendels, François

doi:10.1088/0960-1317/16/8/037

Cited by 69 publications

(40 citation statements)

References 34 publications

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“…Many methods, including the dynamic method (forced and thermal oscillation), static loading and FEA methods were widely used to calibrate the stiffness of the cantilever [33]. In [34], a hybrid method is introduced for the calibration of the spring constants of atomic force microscopy cantilevers.…”

Section: Calibration Of the Microcantilevermentioning

confidence: 99%

High-sensitivity mass and position detection of micro-objects adhered to microcantilevers

Xie

Vitard

Haliyo

et al. 2008

J. Micro-Nano Mech.

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A dynamic method for mass detection, considering attaching positions of micro-objects on microcantilevers, is introduced. Two models based on the RayleighRitz method were developed for analyses of the first flexural and the first torsional modes of a "cantilevermass" system, respectively. Due to one-to-one correspondence between the longitudinal adhering positions of the micro-objects and the flexural resonant frequencies of the "cantilever-mass" system, the first model was employed for high-sensitivity mass detections of multi-object with different attaching positions on the cantilevers. The second model was developed for the analyses of links between the first torsional frequency of the "cantilever-mass" system and the transverse attaching positions of the micro-objects. Uniting these two models, the longitudinal and transverse attaching positions of one micro-object can be determined. Experimental results of polystyrene microspheres and ambrosia pollens attached on the microcantilever in the air validated the setup of the analytical models.

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Section: Calibration Of the Microcantilevermentioning

confidence: 99%

High-sensitivity mass and position detection of micro-objects adhered to microcantilevers

Xie

Vitard

Haliyo

et al. 2008

J. Micro-Nano Mech.

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“…A hybrid solution was presented by Mendels et al basing on the analysis of the probes oscillations profiles, acquired with vibrometer at base and higher resonance frequencies in the vacuum [122]. Obtained data was combined with finite elements modeling, in order to resolve the physical properties of the probe.…”

Section: Combined Method: Scanning Vibrometer and Feamentioning

confidence: 99%

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Sikora¹

2016

NSNM

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Due to its rapid popularity increase within last three decades, with particular focus on submicrometer quantitative surface's properties imaging, atomic force microscopy (AFM) is still a subject of development and research in terms of both better understanding and efficient utilization of various measurement techniques. Quantitative and comparable measurements at nanoscale are a significant issue, as both: science and industry desire reliable results, allowing to perform repetitive experiments at any time and location. Therefore a numerous analysis and research projects were carried out to provide metrological approach for those techniques in terms of providing the traceability and the uncertainty estimation. In this paper an overview of various methods and approaches towards quantitative determination of the normal spring constant of the AFM probes is presented.

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“…Forced oscillation was employ to determine the thickness t of the cantilever. If we know the resonant frequencies of the cantilever, t can be obtained by [26]:…”

Section: B Normal Force Calibrationmentioning

confidence: 99%

Calibration and nonlinearity compensation for force application in AFM based nanomanipulation

Xie

Vitard

Haliyo

et al. 2008

2008 IEEE/RSJ International Conference on Intelligent Robots and Systems

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Abstract-Both the extent and accuracy of force application in atomic force microscope (AFM) nanomanipulation are significantly limited by the nonlinearity of the commonly used optical lever with a nonlinear position-sensitive detector (PSD). In order to compensate the nonlinearity of the optical lever, a nonlinear calibration method is presented. This method applies the nonlinear curve fit to a full-range position-voltage response of the photodiode, obtaining a continuous function of its voltagerelated sensitivity. Thus, Interaction forces can be defined as integrals of this sensitivity function between any two responses of photodiode voltage outputs, instead of rough transformation with a single conversion factor. The lateral position-voltage response of the photodiode, a universally acknowledged puzzle, was directly characterized by an accurately calibrated force sensor composed of a tippless piezoresistive force sensor, regardless of any knowledge of the cantilevers and laser measuring system. Experiments using a rectangular cantilever (normal force constant 0.24 N/m) demonstrated that the proposed nonlinear calibration method restrained the sensitivity error of normal position-voltage responses to 3.6% and extended the force application range.

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Dynamic properties of AFM cantilevers and the calibration of their spring constants

Cited by 69 publications

References 34 publications

High-sensitivity mass and position detection of micro-objects adhered to microcantilevers

High-sensitivity mass and position detection of micro-objects adhered to microcantilevers

Quantitative Normal Force Measurements by Means of Atomic Force Microscopy Towards the Accurate and Easy Spring Constant Determination

Calibration and nonlinearity compensation for force application in AFM based nanomanipulation

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