2012 IEEE 18th International Mixed-Signal, Sensors, and Systems Test Workshop 2012
DOI: 10.1109/ims3tw.2012.18
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DSP Driven Parallel EVM Testing of Embedded MIMO-OFDM RF Modules

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Cited by 4 publications
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“…Adaptation to process variations is also a key issue in other systems such as low-power RF & wireline systems [9][10][11]. In this context, techniques such as self-learning based adaptation [12][13], power-conscious tuning [14] and system level testing and tuning [15][16][17] concepts have been developed. Although a self-tuning approach based on alternative built-in self-test for RF devices has been developed in the past to reduce testing cost and testing time [18][19][20][21], the work reported in this paper develops, for the first time, a testing and self-tuning methodology that avoids the hazards (voltage spikes) associated with standard testing procedures while providing guarantees for the same.…”
mentioning
confidence: 99%
“…Adaptation to process variations is also a key issue in other systems such as low-power RF & wireline systems [9][10][11]. In this context, techniques such as self-learning based adaptation [12][13], power-conscious tuning [14] and system level testing and tuning [15][16][17] concepts have been developed. Although a self-tuning approach based on alternative built-in self-test for RF devices has been developed in the past to reduce testing cost and testing time [18][19][20][21], the work reported in this paper develops, for the first time, a testing and self-tuning methodology that avoids the hazards (voltage spikes) associated with standard testing procedures while providing guarantees for the same.…”
mentioning
confidence: 99%