2013 18th Ieee European Test Symposium (Ets) 2013
DOI: 10.1109/ets.2013.6569363
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Efficient system-level testing and adaptive tuning of MIMO-OFDM wireless transmitters

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Cited by 4 publications
(4 citation statements)
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“…Response Analysis and Performance Prediction Figure 3. Transceiver loop test and nonlinear solver based transceiver Other than the model parameter computation based performance computation method alternate test methods [6][7][8][9] have also been proposed in the past that allow multiple RF specifications to be to be predicted from a single data acquisition . Consider variations in the process parameter space P that affect the performance determination.…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
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“…Response Analysis and Performance Prediction Figure 3. Transceiver loop test and nonlinear solver based transceiver Other than the model parameter computation based performance computation method alternate test methods [6][7][8][9] have also been proposed in the past that allow multiple RF specifications to be to be predicted from a single data acquisition . Consider variations in the process parameter space P that affect the performance determination.…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
“…Typically constrained test generation is performed to reflect the capability of the hardware used to generate the test. For example, when testing is performed using software running on the baseband DSP of a transceiver unit, band-limited multitone or transient test stimulus can be used [6][7][8][9][10].…”
Section: Infrastructure and Cad Supportmentioning
confidence: 99%
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“…Adaptation to process variations is also a key issue in other systems such as low-power RF & wireline systems [9][10][11]. In this context, techniques such as self-learning based adaptation [12][13], power-conscious tuning [14] and system level testing and tuning [15][16][17] concepts have been developed. Although a self-tuning approach based on alternative built-in self-test for RF devices has been developed in the past to reduce testing cost and testing time [18][19][20][21], the work reported in this paper develops, for the first time, a testing and self-tuning methodology that avoids the hazards (voltage spikes) associated with standard testing procedures while providing guarantees for the same.…”
mentioning
confidence: 99%