2009
DOI: 10.1016/j.microrel.2009.05.003
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Drop impact reliability of edge-bonded lead-free chip scale packages

Abstract: a b s t r a c tThis paper presents the drop test reliability results for edge-bonded 0.5 mm pitch lead-free chip scale packages (CSPs) on a standard JEDEC drop reliability test board. The test boards were subjected to drop tests at several impact pulses, including a peak acceleration of 900 Gs with a pulse duration of 0.7 ms, a peak acceleration of 1500 Gs with a pulse duration of 0.5 ms, and a peak acceleration of 2900 Gs with a pulse duration of 0.3 ms. A high-speed dynamic resistance measurement system was … Show more

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Cited by 14 publications
(6 citation statements)
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“…The simulation of drop test is performed by neglecting the damping. The results are consistent with the literature regarding the dynamic response of the system and the stress distribution [2]. These results show that solder balls at the corners of the components are under the greatest stress and that if there was failure, it would manifest itself as a crack behind the ball, that is to say the border or at the interface with the PCB (Figure 3).…”
Section: Methodssupporting
confidence: 91%
“…The simulation of drop test is performed by neglecting the damping. The results are consistent with the literature regarding the dynamic response of the system and the stress distribution [2]. These results show that solder balls at the corners of the components are under the greatest stress and that if there was failure, it would manifest itself as a crack behind the ball, that is to say the border or at the interface with the PCB (Figure 3).…”
Section: Methodssupporting
confidence: 91%
“…15, and it is the tension which results in joint fracture [5]. The failure modes reported [6] include pad cratering (83.3%), I/O trace fracture (73.3%), board side solder crack (33.3%), daisy chain trace fracture (3.3%), and chip side solder crack (1.7%) in terms of percentage of analyzed components. Study of Srinivas shows the failure rate of bottom joints is higher than top joints for PoP upon drop [7].…”
Section: Failure Modes Upon Dropmentioning
confidence: 99%
“…Today’s manufacturing industry is rapidly evolving to provide competitive products [ 6 , 22 ]. This product development is also improving in parallel with new technologies nowadays [ 23 ].…”
Section: Introductionmentioning
confidence: 99%