Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model

Oproglidis, T.A.; Tassis, D. H.; Tsormpatzoglou, A.; Ghibaudo, G.; Dimitriadis, C. A.

doi:10.1016/j.sse.2020.107835

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Drain current local variability analysis in nanoscale junctionless FinFETs utilizing a compact model

Cited by 8 publications

References 20 publications

Analytical model and sensitivity analysis of a gate-engineered dielectric modulated junctionless nanowire transistor-based biosensor

Analytical model and sensitivity analysis of a gate-engineered dielectric modulated junctionless nanowire transistor-based biosensor

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