Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Meng, Lei; Nagalingam, D.; Bhatia, Charanjit S.; Street, A.G.; Phang, J.C.H.

doi:10.1016/j.solmat.2011.05.022

Cited by 16 publications

(4 citation statements)

References 9 publications

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“…This image clearly demonstrates the defect localization capability of EBIC as several defects are visible. When combined with SE and other techniques as reported earlier [13,14], EBIC can allow easy correlation and accurate analysis of the nature of the defects. Fig.…”

Section: Scebic Setup and Experimentsmentioning

confidence: 91%

Single contact electron beam induced current technique for solar cell characterization

Meng

Street

Phang

et al. 2013

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)

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This paper reports the first demonstration of single contact electron beam induced current (SCEBIC) technique on multicrystalline silicon (mc-Si) solar cells. A lumped single-diode analytical model is also proposed to theoretically explain the SCEBIC phenomenon within solar cells as well as the current transient characteristics of the major model parameters, such as shunt resistance R sh , junction capacitance C j , and parasitic capacitance C s . The accuracy of the analytical model is then verified using PSPICE simulations, which show a close match with the experimental results. It is found that a large value of parasitic capacitance C s is necessary to achieve good SCEBIC signal strength with a relatively low signal-to-noise ratio (SNR), and this is realized experimentally by adopting a metal enclosure in the measurement setup. In addition, the advantage of SCEBIC over conventional double-contact method is also demonstrated by SCEBIC characterization of partially processed solar cells, which clearly illustrates the high degree of flexibility of SCEBIC in solar cell characterization.

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Section: Scebic Setup and Experimentsmentioning

confidence: 91%

Single contact electron beam induced current technique for solar cell characterization

Meng

Street

Phang

et al. 2013

2013 IEEE 39th Photovoltaic Specialists Conference (PVSC)

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“…Owing to the difficulty in identifying micrometer-range sub-surface defects and the limited image resolution, most of these techniques can be used only for detecting topographical defects [9,10]. Therefore, costly techniques, such as scanning electron microscopy and transmission electron microscopy, involving destructive sample sectioning have been employed to achieve the desirable visualization [11][12][13]. Since non-invasive techniques can overcome the drawbacks of existing inspection techniques, they have attracted significant attention in recent years.…”

Section: Introductionmentioning

confidence: 99%

Vision-Inspection-Synchronized Dual Optical Coherence Tomography for High-Resolution Real-Time Multidimensional Defect Tracking in Optical Thin Film Industry

et al. 2020

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Large-scale product inspection is an important aspect in thin film industry to identify defects with a high precision. Although vision line scan camera (VLSC)-based inspection has been frequently implemented, it is limited to surface inspections. Therefore, to overcome the conventional drawbacks, there is a need to extend inspection capabilities to internal structures. Considering that VLSC systems have access to rich information, such as color and texture, high-resolution real-time multimodal optical synchronization between VLSC and dual spectral domain optical coherence tomography (SD-OCT) systems was developed with a laboratory customized in-built automated defect-tracking algorithm for optical thin films (OTFs). Distinguishable differences in the color and texture of the bezel area were precisely determined by the VLSC. Detailed OCT assessments were conducted to verify the detection of previously unobtainable border regions and micrometer-range sub-surface defects. To enhance the accuracy of the method, VLSC images were aided for the precise surface defect identification using OCT and the image acquisition, signal processing, image analysis, and classification of both techniques were simultaneously processed in real-time for industrial applicability. The results demonstrate that the proposed method is capable of detecting and enumerating total number of defects in OTF samples with exceptional resolution and in a cost-effective manner facilitating wide area inspection for OTF samples.

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“…Lastly, scanning electron microscopy (SEM) [9,10] and transmission electron microscopy (TEM) [11,12] can be implemented for the measurement of nanostructures. These microscopy techniques yield an ultrahigh resolution.…”

Section: Introductionmentioning

confidence: 99%

Optical inspection of solar cells using phase-sensitive optical coherence tomography

Tsai

Chang

Yao

et al. 2015

Solar Energy Materials and Solar Cells

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Distinguishing morphological and electrical defects in polycrystalline silicon solar cells using scanning electron acoustic microscopy and electron beam induced current

Cited by 16 publications

References 9 publications

Single contact electron beam induced current technique for solar cell characterization

Single contact electron beam induced current technique for solar cell characterization

Vision-Inspection-Synchronized Dual Optical Coherence Tomography for High-Resolution Real-Time Multidimensional Defect Tracking in Optical Thin Film Industry

Optical inspection of solar cells using phase-sensitive optical coherence tomography

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