Abstract:This paper reports the first demonstration of single contact electron beam induced current (SCEBIC) technique on multicrystalline silicon (mc-Si) solar cells. A lumped single-diode analytical model is also proposed to theoretically explain the SCEBIC phenomenon within solar cells as well as the current transient characteristics of the major model parameters, such as shunt resistance R sh , junction capacitance C j , and parasitic capacitance C s . The accuracy of the analytical model is then verified using PSP… Show more
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