Dispersive parameters for complex refractive index of p- and n-type silicon from spectrophotometric measurements in spectral range 200–2500nm

El-Zaiat, El-Sayed; Youssef, G. M.

doi:10.1016/j.optlastec.2014.07.014

Cited by 18 publications

(3 citation statements)

References 20 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…We should also note that such a classic Complementary Metal-Oxide-Semiconductor (CMOS) material as silicon also appears to be highly suitable for gradient-index nanophotonics applications. Similar to graphite, silicon exhibits very large and purely imaginary dielectric permittivity ε ∼ 50i around 290 nm [12], which strongly depends on the doping level. Therefore, silicon-based gradient index nanowaveguides may potentially be fabricated using CMOS technology, which would greatly extend various silicon photonics applications.…”

Section: Resultsmentioning

confidence: 99%

Gradient-index nanophotonics

Smolyaninov

2021

J. Opt.

View full text Add to dashboard Cite

It is demonstrated that a new kind of low-loss surface electromagnetic wave may propagate along a planar surface inside a lossy medium if the medium permittivity changes continuously across such surface. Similar to surface plasmons, the wavelength of this wave may be considerably shorter than the light wavelength in free space, which may enable its applications in super-resolution microscopy and nanolithography techniques. However, unlike plasmonics-based nanophotonic devices, which are typically built using a very limited number of low loss optical materials, the newly found class of surface waves may be supported by a much broader range of lossy media. Such materials as graphite seems to be ideal in UV nanophotonics applications. On the opposite side of the electromagnetic spectrum, similar long-range surface electromagnetic radio waves are capable of propagating underwater along a sandy seabed, which may enable efficient underwater radio communication and imaging.

show abstract

Section: Resultsmentioning

confidence: 99%

Gradient-index nanophotonics

Smolyaninov

2021

J. Opt.

View full text Add to dashboard Cite

show abstract

“…We set refractive index of HRIM as value n = n(Si li con) + n ( n = 0.8). GeSi alloy may be a suitable choice of HRIM [37]- [40]. Due to bevels of the HRIM, the propagation constant of the waveguide varies along the wave propagation direction.…”

Section: Device Designmentioning

confidence: 99%

Design of Compact TE-Polarized Mode-Order Converter in Silicon Waveguide With High Refractive Index Material

Zhu

et al. 2018

IEEE Photonics J.

View full text Add to dashboard Cite

We propose and numerically demonstrate a design of bidirectional transverse electric (TE) polarized mode-order converter based on silicon-on-insulator platform. This converter is realized by introducing high refractive index material inlaid in a silicon slab waveguide. Simulated by three-dimensional finite-difference time-domain method, the forward (TE0 to TE1-like conversion) transmittance reaches approximately 88.2%, while the backward value (TE1 to TE0-like conversion) is about 89.4% at the wavelength of 1550 nm. The footprint of this converter is as small as 0.95 × 1.5 μm 2. Fabrication tolerance analysis demonstrates satisfactory robustness. Moreover, we present a polarization-independent converter with slightly modified geometry. The transmittance keeps above 87.2% within the wavelength range from 1500 nm to 1600 nm for both TE and transverse magnetic modes. These devices are expected to contribute to the on-chip mode division multiplexing.

show abstract

“…[9][10][11] Later, exact analytical solutions have been found and applied to the study of slabs. [12][13][14][15] The main challenge lies here in the fact that measuring R and T at the same location is difficult. 6 Moreover, materials with low-refractive index yield weak reflection; thus, the precise measurement of R appears tricky in this case.…”

Section: Introductionmentioning

confidence: 99%

A New Simple Analytical Method for a Highly Accurate Determination of the Optical Parameters of a Slab from Transmittance Data

Jaffré

Khai

et al. 2022

Appl Spectrosc

View full text Add to dashboard Cite

To date, determining with high accuracy the optical parameters (extinction coefficient k and refractive index n) of a slab from the sole transmittance data requires an inverse method based on numerical iteration procedures. In this paper, we propose a new inverse analytical method of extracting ( k, n) without numerical iterative processes. The high accuracy of this new inverse method is assessed, and as an application example, the optical parameters of CaF2 and Si substrates are determined in the IR spectral range of 4–8 µm.

show abstract

Dispersive parameters for complex refractive index of p- and n-type silicon from spectrophotometric measurements in spectral range 200–2500nm

Cited by 18 publications

References 20 publications

Gradient-index nanophotonics

Gradient-index nanophotonics

Design of Compact TE-Polarized Mode-Order Converter in Silicon Waveguide With High Refractive Index Material

A New Simple Analytical Method for a Highly Accurate Determination of the Optical Parameters of a Slab from Transmittance Data

Contact Info

Product

Resources

About