2007
DOI: 10.1063/1.2750523
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Dispersion of silicon nonlinearities in the near infrared region

Abstract: Solution-processed cavity and slow-light quantum electrodynamics in near-infrared silicon photonic crystals Appl. Phys. Lett. 95, 131112 (2009); 10.1063/1.3238555 Cadmium telluride bulk crystal as an ultrafast nonlinear optical switch

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Cited by 216 publications
(167 citation statements)
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“…Unfortunately, there is often a lack of complete measurement data at a wavelength range of interest, and also measurement results from different groups could vary widely. For silicon, data from several sources are available [160,161]. A recently published review paper [133] shows a prediction of third-order nonlinear susceptibility χ , using the results from [133].…”
Section: Methodsmentioning
confidence: 99%
“…Unfortunately, there is often a lack of complete measurement data at a wavelength range of interest, and also measurement results from different groups could vary widely. For silicon, data from several sources are available [160,161]. A recently published review paper [133] shows a prediction of third-order nonlinear susceptibility χ , using the results from [133].…”
Section: Methodsmentioning
confidence: 99%
“…We note, however, that although our analysis above incorporates effects arising from linear losses (e.g., due to material absorption or radiation), it neglects important and detrimental sources of nonlinear losses in the telecom range, including two-photon and free-carrier absorption [86,87]. Techniques that mitigate the latter exist, e.g., reverse biasing [88], but in their absence it may be safer to operate in the spectral region below the half-band-gap of Si [78]. One possibility is to operate at λ c0 = 2.2 μm, where χ (3) ≈ 1.5×10 −18 m 2 /V 2 [78], leading to a = 627 nm, and approximately four-times larger P crit 0 ≈ 200 mW.…”
Section: Power Requirementsmentioning
confidence: 99%
“…Our designs are based on a particular class of PhC nanobeam structures, depicted schematically in Figs an adjacent waveguide formed by the removal of holes on one side of the defect. We restrict our analysis to dielectric materials with high nonlinearities at near-infrared and midinfrared wavelengths [1], and in particular focus on undoped silicon, whose refractive index n ≈ 3.4 and Kerr susceptibility χ (3) ∼ 10 −18 m 2 /V 2 [78]. Before delving into the details of any particular design, we first describe the basic considerations required to achieve the desired high-efficiency characteristics.…”
Section: Fdtd Simulations and Nanobeam Designsmentioning
confidence: 99%
“…Using a cw probe signal to interrogate the modulation instability spectrum, we demonstrate parametric amplification > 40 dB with an on-chip gain bandwidth wider than 580 nm, as well as narrowband Raman-assisted peak gain > 50 dB. © 2011 Optical Society of America OCIS Codes: 130.4310, 190.4380, 190.4970 Two-photon absorption (TPA) in Si vanishes at wavelengths approaching λ = 2200 nm, while its nonlinear Kerr refractive index n2 stays comparatively constant [1,2]. Hence, the nonlinear figure of merit (FOM) (n2/βλ) increases dramatically near silicon's TPA threshold.…”
mentioning
confidence: 99%
“…Two-photon absorption (TPA) in Si vanishes at wavelengths approaching λ = 2200 nm, while its nonlinear Kerr refractive index n2 stays comparatively constant [1,2]. Hence, the nonlinear figure of merit (FOM) (n2/βλ) increases dramatically near silicon's TPA threshold.…”
mentioning
confidence: 99%