1998
DOI: 10.1107/s0021889897019559
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Dislocations and Grain Size in Electrodeposited Nanocrystalline Ni Determined by the Modified Williamson–Hall and Warren–Averbach Procedures

Abstract: Electrodeposited nanocrystalline Ni foils were studied by high-resolution X-ray diffractometry. The full width at half-maximum and Fourier coefficients were found to vary rather anisotropically as a function of diffraction order. The modified Williamson-Hall plot and the modified Warren-Averbach analysis, developed recently by taking into account the dislocation contrast in peak broadening, have been applied to interpret this anisotropic behaviour in terms of grain size, dislocation densities and twin boundari… Show more

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Cited by 125 publications
(44 citation statements)
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“…Using methods that allow the separation of broadening from grain size and inhomogeneous strains, [28] no increase in grain size was observed within the first regime for both HPT-Ni and ED-Ni. In other words, the extra recovery seen in ED-Ni can be entirely associated with a recovery in root-mean-square (RMS) strain, independent of deformation history.…”
mentioning
confidence: 55%
“…Using methods that allow the separation of broadening from grain size and inhomogeneous strains, [28] no increase in grain size was observed within the first regime for both HPT-Ni and ED-Ni. In other words, the extra recovery seen in ED-Ni can be entirely associated with a recovery in root-mean-square (RMS) strain, independent of deformation history.…”
mentioning
confidence: 55%
“…This is a simple method, but accurate only to the order of magnitude. However, since Scherrer's work, line profile analysis has made enormous progress 21,22,23,24,25,26,27,28,29,30 .…”
Section: Powder Patterns and Size Informationmentioning
confidence: 99%
“…Anisotropic crystallite shape are a delicate phenomenon [26] which has been treated by special elegance in the case of ZnO nanoparticles [23]. Finally, anisotropic strain broadening is a general feature of powder patterns [43][44][45][46][47][48][49][50][51][52][53][54][55][56], which is generally related to dislocations and the elastic properties of crystals. In the present work a few typical examples are reviewed where the microstructure of nanocrystalline materials has been characterized by the method of XLPA.…”
Section: Introductionmentioning
confidence: 99%