Nanocrystalline materials studied by powder diffraction line profile analysis

Abstract

Abstract. X-ray powder diffraction is a powerful tool for characterising the microstructure of crystalline materials in terms of size and strain. It is widely applied for nanocrystalline materials, especially since other methods, in particular electron microscopy is, on the one hand tedious and time consuming, on the other hand, due to the often metastable states of nanomaterials it might change their microstructures. It is attempted to overview the applications of microstructure characterization by powder diffraction on nanocrystalline metals, alloys, ceramics and carbon base materials. Whenever opportunity is given, the data provided by the X-ray method are compared and discussed together with results of electron microscopy. Since the topic is vast we do not try to cover the entire field.

Surface Alloying of Nanocrystalline Fe-0.45 wt Pct C Alloy Subjected to Surface Mechanical Attrition Treatment Within Cr Powders

“…In contrast, XRD is able to distinguish these subgrains with small misorientations [15], even less than 1 • -2 • , and therefore gives the average size of dislocation cells or subgrains. Namely, a grain displayed in conventional TEM image may consist of several subgrains recognized by XRD, which was also verified by other researchers [17,18]. However, within such small nanograin size in this investigation, dislocations can hardly exist in the interior of the nanograin and subgrains cannot be created inside the grains.…”

Characterization of defect structures in nanocrystalline materials by X-ray line profile analysis

“…It is noted here that, a review on LPA has recently been published in the same journal by the same authors [66]. It is important, however, that authors have taken special care to avoid overlap of the subject matter of [66] and the present paper.…”

“…It is important, however, that authors have taken special care to avoid overlap of the subject matter of [66] and the present paper. Moreover, the present review deals with the effects of planar defects and polymers which were not treated in [66]. Finally, the method of LPA developed to such an extent during the last decades that it is hard to review in detail the whole field in a single journal paper.…”

Dataset on cellulose nanoparticles from blue agave bagasse and blue agave leaves

“…Crystallite domain sizes ( δ hkl ) were estimated with the Scherrer equation [11] , [12] . using the peaks corresponding to the crystalline regions: The different crystallinities, as well as the contributions of each crystallite domain size, is present in Table 1…”