2005
DOI: 10.1103/physrevb.72.035412
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Nanoparticle size distribution estimation by a full-pattern powder diffraction analysis

Abstract: The increasing scientific and technological interest in nanoparticles has raised the need for fast, efficient and precise characterization techniques. Powder diffraction is a very efficient experimental method, as it is straightforward and non-destructive. However, its use for extracting information regarding very small particles brings some common crystallographic approximations to and beyond their limits of validity. Powder pattern diffraction calculation methods are critically discussed, with special focus … Show more

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Cited by 29 publications
(24 citation statements)
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“…Their shape has been fitted in detail assuming a size distribution of sharply defined spherical magnetic domains. A magnetic reflection is then represented as the distribution-weighted sum of the peak profiles of domains of different sizes, each of them being convoluted with the instrument resolution function [14]. Two types of distributions, namely, the log-normal and gamma distributions, were used for the fit of the data shown in Fig.…”
mentioning
confidence: 99%
“…Their shape has been fitted in detail assuming a size distribution of sharply defined spherical magnetic domains. A magnetic reflection is then represented as the distribution-weighted sum of the peak profiles of domains of different sizes, each of them being convoluted with the instrument resolution function [14]. Two types of distributions, namely, the log-normal and gamma distributions, were used for the fit of the data shown in Fig.…”
mentioning
confidence: 99%
“…This adds small anisotropic contributions on peaks at small diffraction angles. Nanometer-sized fcc-Cu clusters are modeled as in [26], assuming near-spherical clusters with a log-normal diameter distribution, in agreement with TEM results. Diameters ranged from 0.28 to 102 nm with 0.56 nm step.…”
Section: Xrd Data Analysis and Simulationsmentioning
confidence: 95%
“…One important issue is that disorder analysis of partially periodic systems needs a statistical description of the defectiveness, while the Debye method is intrinsically deterministic and can be made applicable to stochastically variable atomic structures. At the larger sizes, still in the nanometric range (10-30 nm), shape convolution methods have also proved to be effective [180,181], although with precise limitations [180].…”
Section: X-ray Powder Diffractionmentioning
confidence: 99%