Disentangling time in a near-field approach to scanning probe microscopy

Farina, Marco; Lucesoli, Agnese; Pietrangelo, Tiziana; Donato, Andrea Di; Fabiani, Silvia; Venanzoni, Giuseppe; Mencarelli, Davide; Rozzi, T.; Morini, Antonio

doi:10.1039/c1nr10491h

Cited by 47 publications

(21 citation statements)

References 10 publications

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“…Unlike destructive imaging techniques such as focused ion beam milling combined with scanning electron microscopy ( 22 ), transmission electron microscopy (TEM) ( 23 ), and secondary ion mass spectrometry (SIMS) ( 24 ), SMM experiments can be performed with virtually no sample modification, in an ambient environment, using a standard atomic force microscope (AFM) ( 25 ) or STM ( 26 ) combined with a vector network analyzer (VNA) ( 27 ) or custom-made electronics ( 28 ). Typically, resonators ( 29 ) or matching circuits ( 28 ), as well as simpler direct connections ( 30 , 31 ), are used to sense the minute electrical changes that come from the SMM probe. Recently, it has been shown that SMM is capable of visualizing buried conducting structures ( 20 , 21 , 32 ) and differently doped bulk regions buried below an insulating layer ( 33 ).…”

Section: Introductionmentioning

confidence: 99%

Nondestructive imaging of atomically thin nanostructures buried in silicon

et al. 2017

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Section: Introductionmentioning

confidence: 99%

Nondestructive imaging of atomically thin nanostructures buried in silicon

et al. 2017

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“…Hence, their use do not eliminates topographic cross-talk effects. Finally, the approach proposed by Farina et al, 42 based in analysing the SMM response in time rather than in frequency, while allowing to cancel the stray, it doesn't solve the problem of the local signal changes due to the tip vertical movement, which still occurs between the tip apex and the sample. In this scope, our method represents a valid option to resolve these issues, which is even applicable with non-optimal conventional, and widely available, conductive AFM probes.…”

Section: Discussionmentioning

confidence: 99%

“…To end up, we would like to strees that the problematics of disantangling topographic from electric permittivity contributions in AFM-SMM capacitance images can not be solved by other approaches proposed to date, which involve the use of alternative imaging modes, such as constant height imaging, 41 the use of special tip configurations, such as shielded probes 6,8 and open ended coaxial probes, 3 or the use of specific post-processing algorithms, such as time domain. 42 For instance, constant height imaging by definition contains no topographic cross-talk effects, since the probe-substrate distance is not varied. However, in non-planar samples it provides optimal signal to noise ratio only on the tallest parts of the sample, i.e.…”

Section: Discussionmentioning

confidence: 99%

Direct mapping of the electric permittivity of heterogeneous non-planar thin films at gigahertz frequencies by scanning microwave microscopy

Biagi

Badino

Fabregas

et al. 2017

Phys. Chem. Chem. Phys.

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We obtained maps of the electric permittivity at ~19 GHz frequencies on non-planar thin film heterogeneous samples by means of combined atomic force-scanning microwave microscopy (AFM-SMM). We show that the electric permittivity maps can be obtained directly from the capacitance images acquired in contact mode, after removing the topographic cross-talk effects. This result demonstrates the possibility to identify the electric permittivity of different materials in a thin film sample irrespectively of their thickness by just direct imaging and processing. We show, in addition, that quantitative maps of the electric permittivity can be obtained with no need of any theoretical calculation or complex quantification procedure when the electric permittivity of one of the materials is known. To achieve these results the use of contact mode imaging is a key factor. For non-contact imaging modes the effects of the local sample thickness and of the imaging distance makes the interpretation of the capacitance images in terms of the electric permittivity properties of the materials much more complex. Present results represent a substantial contribution to the field of nanoscale microwave dielectric characterization of thin film materials with important implications for the characterization of novel 3D electronic devices and 3D nanomaterials.

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“…Their work indicated that AFM can be an effective tool for gene/molecule delivery. Furthermore, nowadays, with the development of AFM-based and microwave microscope technology, the THP1 cells (Oh et al 2011) Yucca filamentosa's epidermal cells (Park et al 2005) C2C12 cells (Farina et al 2011(Farina et al , 2012, cancerous breast cells (Tabib-Azar and Wang 2004) have been imaged by scanning microwave microscopy.…”

Section: Introductionmentioning

confidence: 99%

Microwave atomic force microscope: MG63 osteoblast-like cells analysis on nanometer scale

et al. 2015

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combinations of proteins, carbohydrates, lipids and nucleic acids. These compositions carry out complicated biochemical and physiological process inside the cell. To study these complicated process, acquiring the morphological and fundamental function of these intracellular structures become an indispensable process.With the development of biotechnology, more and more approaches have been developed to investigate the intracellular structures. Immunofluorescence staining was the most widely used method to detect the changes of microfilaments in studying the behavior of cytoskeleton (Tumminia et al. 1998;Xu et al. 2011). Some cellular organelles such as chloroplast have been isolated from plant cells and their morphological structures and functions were investigated in the process of photosynthesis. In order to observe the intracellular structures, special microscopes have been designed. Tokita and cooperators have developed a new kind of microscope that was able to observe the internal structure of living cells (Matsuura-Tokita et al. 2006). Researchers from Caltech tried to observe the arrangement of individual proteins inside cells in a life-like state with the electron crymicroscope (Briegel et al. 2009). Transmission electron microscopy (TEM) and scanning electron microscope (SEM) also play important roles in cellular research.Advances in our understanding of molecular and cellular biology were and still are dictated by the development of new techniques, allowing the structural and functional study of living materials. The nano-scale surface analysis of microbial cells represents a significant challenge of current microbiology and is critical for developing new biotechnological and biomedical applications. The exploration of microbes using atomic force microscopy (AFM) is an exciting research field that has expanded rapidly in the past few years. AbstractIn this paper, we report a non-invasive and nondestructive probing method for analyzing the MG63 osteoblast-like cells. High frequency microwave atomic force microscope (M-AFM) can be used to measure the surface topography and microwave image of MG63 cells simultaneously in one scanning process. Under the frequency modulation AFM mode, the M-AFM probe tip can scan above the cell surface, maintaining a constant stand-off distance and the created lateral forces were small enough as not to sweep away or deform the fragile biomolecules. By analyzing the results, quantification such as, the number and distribution of organelles and proteins of MG63 cells as well as their dimension and electrical property information can be characterized. The unique potentials of that M-AFM imaging biological substrates with no damaging manner and nanometer scale resolution, while the original structure and function of the biomolecules during the investigation are preserved, make this technique very attractive to biologists.

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Disentangling time in a near-field approach to scanning probe microscopy

Cited by 47 publications

References 10 publications

Nondestructive imaging of atomically thin nanostructures buried in silicon

Nondestructive imaging of atomically thin nanostructures buried in silicon

Direct mapping of the electric permittivity of heterogeneous non-planar thin films at gigahertz frequencies by scanning microwave microscopy

Microwave atomic force microscope: MG63 osteoblast-like cells analysis on nanometer scale

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