2008
DOI: 10.1002/pssc.200778690
|View full text |Cite
|
Sign up to set email alerts
|

Direct MOVPE‐ and MBE‐growth of a‐plane GaN on r‐plane sapphire

Abstract: We report on the growth of pit‐free a‐plane GaN on (1$ \bar 1 $02) sapphire (r‐plane) substrates by metal organic vapor phase epitaxy (MOVPE) using a three step growth method without low temperature nucleation layer. X‐ray diffraction ω ‐scans of the symmetric GaN (11‐20) reflex revealed for 1.2 μm thick crack‐ and pit‐free GaN layers low FWHM of 885 arcsec and 2484 arcsec measured by inclination in c‐ and m‐direction, respectively. To analyze the evolution growth was stopped at different stages and the sample… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1

Citation Types

0
12
0

Year Published

2008
2008
2011
2011

Publication Types

Select...
6

Relationship

2
4

Authors

Journals

citations
Cited by 8 publications
(12 citation statements)
references
References 6 publications
0
12
0
Order By: Relevance
“…1(a)-(c). In a first step, r-plane sapphire substrates were nitridated in a Thomas Swan 3 Â 2 00 close coupled vertical showerhead reactor, using a mixed NH 3 /H 2 ambient with a ratio of 1:1 at 1323 K [13]. Afterwards, for some samples, GaN islands ( Fig.…”
mentioning
confidence: 99%
“…1(a)-(c). In a first step, r-plane sapphire substrates were nitridated in a Thomas Swan 3 Â 2 00 close coupled vertical showerhead reactor, using a mixed NH 3 /H 2 ambient with a ratio of 1:1 at 1323 K [13]. Afterwards, for some samples, GaN islands ( Fig.…”
mentioning
confidence: 99%
“…The origin of the nanorods appears to be within the a-plane GaN layer, but could also be at the a-plane GaN/sapphire interface as proposed by Aschenbrenner et al [10]. Due to TEM specimen preparation parts of the nanorods may be truncated in such a way that the origin of the rods is outside of the TEM specimen.…”
Section: Investigation Of the Overgrown Samplementioning
confidence: 90%
“…Figure 3 shows a STEM micrograph of the structure after the overgrowth. From a first inspection one can see that the sapphire substrate is covered by a smooth layer of GaN [10], on which the nanorods are visible. From diffraction patterns we found that the layer was a-plane GaN, as one can expect from growth on r-plane sapphire.…”
Section: Investigation Of the Overgrown Samplementioning
confidence: 99%
See 2 more Smart Citations