Diffraction Control Methods of Extended Products’ Diameter

Abstract

In this paper the measurement methods for extended objects’ geometry on the basis of effect of light diffraction which can be applied to technological control of products with wide range of diameters from the smallest to the largest are described. During measurement the method that allows to minimize the influence of disturbing factors on the results of measurements of diameter of thin fibers of small diameters of micron is described. Disturbing factors include excessive flare of area of the central maximum range. The diffraction method is considered that allows to increase to units of micrometers the resolution of the optical measuring converters used in devices to perform technological control of cylindrical extended products of a large diameter such as: cables, wires, cords, etc. The transformation function allowing to calculate diameter of cylindrical products irrespective of their location in a control zone on the basis of the diffraction method of delimitation of the product shadow in optical two-coordinate converters with the dispersing laser bunch is offered and experimentally confirmed. The achieved results can be used for development of high-precision optical devices of technological control of outer diameter and eccentricity of products for cable, pipe and other products in different industry fields.

Study of physical control methods for metric parameters of extended products in cable industry

“…Inductive sensors allow appropriate selection of the supply current frequency to increase the sensitivity to a certain controlled value and reduce it in relation to other factors acting on the sensor. For example, by choosing the optimal conversion frequency of the inductive transducer, it is possible to reduce the effect on measurement results of the transverse offsets of the wire, as well as to offset from external electromagnetic interference [16][17][18][19].…”

Offset compensation cable external diameter measurement system

“…For the inaccurate problem in the offset state offline cable diameter parameter measurement, the article puts forward a kind of offset compensation wire diameter measurement system based on space coordinate transform, by the method of analytic geometry corresponding to the laser light source located in the charge-coupled device (CCD plane rectangular coordinate system) and the use of building space coordinates transformation line diameter measurement system, to compensate the measurement error caused by cable offset. We use a small number of optical auxiliary components in this scheme to optimize the laser beam and improve the uneven distribution of light flux in the measurement area [17] . At the same time, this method can be combined with the programming language and realized through software programming by using microcontrollers such as ARM.…”