Differential Near-Field Scanning Optical Microscopy

Ozcan, Aydogan; Cubukcu, Ertugrul; Bilenca, A.; Crozier, Kenneth B.; Bouma, Brett E.; Capasso, Federico; Tearney, Guillermo J.

doi:10.1021/nl062110v

Cited by 24 publications

(17 citation statements)

References 23 publications

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“…To overcome this situation, a computational trick can be used: the Differential Near-Field Scanning Optical Microscopy (differential NSOM) [24]. In this case, an aperture with a size comparable to that of the incident wavelength is scanned in the nearfield of the object of interest.…”

Section: Basic Aperturesmentioning

confidence: 99%

Review of Near-Field Terahertz Measurement Methods and Their Applications

Adam

2011

J Infrared Milli Terahz Waves

195

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In the last decades, many research teams working at Terahertz frequencies focused their efforts on surpassing the diffraction limit. Numerous techniques have been investigated, combining methods existing at optic wavelength with THz system such as Time Domain Spectroscopy. The actual development led on one side to a resolution as high as λ/3000 and one the other side to a video-rate recording. The purpose of this paper is to give an overview of the history of the field, to describe the different approaches, to give examples of existing applications and to draw the perspective for this research area.

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Section: Basic Aperturesmentioning

confidence: 99%

Review of Near-Field Terahertz Measurement Methods and Their Applications

Adam

2011

J Infrared Milli Terahz Waves

195

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“…The field-of-view (FOV) area for the DNSOM with a square aperture is 2 W × 2 W = 4 W 2 . In order to avoid irreparable information loss, the object should be smaller than 2 W in either dimension [39]. For flat samples, a larger FOV can be achieved using, in parallel to the scanning DNSOM aperture/detector, a moveable rectangular mask that has an area of 2 W × 2 W .…”

Section: A Theoretical Background Of the Dnsommentioning

confidence: 99%

“…However, today's state of the art for aperture-type NSOM has SNR and contrast issues for achieving an ultrahigh spatial resolution of <50 nm routinely, on a day-to-day basis. To address this issue of aperture-type NSOM systems, in prior work [39], [40] we introduced an alternative approach for aperturetype NSOM, termed differential near-field scanning optical microscopy (DNSOM). DNSOM involves scanning a relatively large square aperture [see, e.g., Fig.…”

mentioning

confidence: 99%

Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays

Ozcan

Cubukcu

Bilenca

et al. 2007

IEEE J. Select. Topics Quantum Electron.

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Abstract-In this paper, we introduce a new aperture-type nearfield scanning optical microscopy (NSOM) imaging concept that relies on specially designed large-area (e.g., >200 nm × 200 nm) aperture geometries having sharp corners. Unlike in conventional NSOM, the spatial resolution of this near-field imaging modality is not determined by the size of the aperture, but rather by the sharpness of the corners of the large aperture. This approach significantly improves the light throughput of the near-field probe and, hence, increases the SNR. Here, we discuss the basic concepts of this near-field microscopy approach and illustrate both theoretically and experimentally how an array of detectors can be utilized to further improve the SNR of the near-field image. The results of this work are particularly relevant for imaging of biological samples at a spatial resolution of <50 nm with significantly improved image quality.Index Terms-Differential NSOM (DNSOM), near-field imaging, near-field scanning optical microscopy (NSOM), SNOM.

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“…Differential Near field Scanning Optical Microscopy (DNSOM) involves scanning with a relatively large aperture in the near-field of the object of interest and recording light intensity as a function of scanning position, image reconstruction is achieved by taking the surface derivative of the recorded map [6].…”

Section: Introductionmentioning

confidence: 99%

“…The vertical resolution of the EFSOM depends on the strength of evanescentfields, vertical displacement of the sample and the dynamic range of the photo-detector, while lateral resolution depends on the evanescent-field decay and scanning velocity. Image reconstruction is achieved by taking the spatial derivative of the recorded map similar to [6,7].…”

Section: Introductionmentioning

confidence: 99%

Evanescent field scanning optical microscopy

Sukharenko

Dorsinville

2014

SPIE Proceedings

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The authors propose an alternative method for high resolution optical microscopy -Evanescent Field Scanning Optical Microscopy (EFSOM) which eliminates implementation of the scanning tip compare to classical NSOM technique. The approach involves scanning a sample in the evanescent-field of a prism generated using total internal reflection (TIR) and recording the reflected power as a function of position. The reflection pattern of the wave is collected and processed, using comparative differentiation. The extracted information is processed further to eliminate any distortions. The system is not limited by diffraction and resolution primarily depends on the characteristics of the photo-detector and scanning velocity. Implementation of thin silver layer and coupling of incident radiation into Surface Plasmons Polaritons (SPP) improves system sensitivity and reduces photo detector dynamic range requirements.

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Differential Near-Field Scanning Optical Microscopy

Cited by 24 publications

References 23 publications

Review of Near-Field Terahertz Measurement Methods and Their Applications

Review of Near-Field Terahertz Measurement Methods and Their Applications

Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays

Evanescent field scanning optical microscopy

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