Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays

Ozcan, Aydogan; Cubukcu, Ertugrul; Bilenca, A.; Bouma, Brett E.; Capasso, Federico; Tearney, Guillermo J.

doi:10.1109/jstqe.2007.910799

Cited by 9 publications

(5 citation statements)

References 44 publications

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“…6 Hence the current gold standard for nanoimaging remains electron microscopy in both transmission (TEM) and scanning (SEM) modes, despite the required large capital investment, extensive sample preparation, and incompatibility with live-cell imaging. Scanning probe microscopy techniques [7][8][9][10][11][12] may also be used, although they still require a large capital investment, involve long acquisition times, and are in general incompatible with live-cell imaging. To provide new solutions for high-resolution imaging needs, the last decade has seen the invention of several super-resolution optical techniques, including structured illumination micro-scopy, [13][14][15] photoactivated localization microscopy (PALM), 16 stochastic optical reconstruction microscopy (STORM), 17 and stimulated emission depletion microscopy (STED).…”

Section: Introductionmentioning

confidence: 99%

Toward giga-pixel nanoscopy on a chip: a computational wide-field look at the nano-scale without the use of lenses

et al. 2013

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The development of lensfree on-chip microscopy in the past decade has opened up various new possibilities for biomedical imaging across ultra-large fields of view using compact, portable, and cost-effective devices. However, until recently, its ability to resolve fine features and detect ultra-small particles has not rivalled the capabilities of the more expensive and bulky laboratory-grade optical microscopes. In this Frontier Review, we highlight the developments over the last two years that have enabled computational lensfree holographic on-chip microscopy to compete with and, in some cases, surpass conventional bright-field microscopy in its ability to image nano-scale objects across large fields of view, yielding giga-pixel phase and amplitude images. Lensfree microscopy has now achieved a numerical aperture as high as 0.92, with a spatial resolution as small as 225 nm across a large field of view e.g., >20 mm2. Furthermore, the combination of lensfree microscopy with self-assembled nanolenses, forming nano-catenoid minimal surfaces around individual nanoparticles has boosted the image contrast to levels high enough to permit bright-field imaging of individual particles smaller than 100 nm. These capabilities support a number of new applications, including, for example, the detection and sizing of individual virus particles using field-portable computational on-chip microscopes.

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Section: Introductionmentioning

confidence: 99%

Toward giga-pixel nanoscopy on a chip: a computational wide-field look at the nano-scale without the use of lenses

et al. 2013

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“…For relative amplitudes equal to 0.1% the observed added noise in the simulation results does not exceed 20% of the surface amplitude. The method can be implemented using a high performance piezoelectric stage, similar equipment is used for scanning tip displacement in NSOM and aperture displacement in DNSOM as used in [1,2,3,4,5,7]. Variations of the signal due to the 20nm by 20nm square roughness of the surface profile are predicted to be about ~ 1% , therefore tolerated noise for this system cannot exceed ~0.01% for optimal surface detection.…”

Section: Efsom With Enhancement By Surface Plasmons Polaritonsmentioning

confidence: 99%

“…The vertical resolution of the EFSOM depends on the strength of evanescentfields, vertical displacement of the sample and the dynamic range of the photo-detector, while lateral resolution depends on the evanescent-field decay and scanning velocity. Image reconstruction is achieved by taking the spatial derivative of the recorded map similar to [6,7].…”

Section: Introductionmentioning

confidence: 99%

Evanescent field scanning optical microscopy

Sukharenko

Dorsinville

2014

SPIE Proceedings

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The authors propose an alternative method for high resolution optical microscopy -Evanescent Field Scanning Optical Microscopy (EFSOM) which eliminates implementation of the scanning tip compare to classical NSOM technique. The approach involves scanning a sample in the evanescent-field of a prism generated using total internal reflection (TIR) and recording the reflected power as a function of position. The reflection pattern of the wave is collected and processed, using comparative differentiation. The extracted information is processed further to eliminate any distortions. The system is not limited by diffraction and resolution primarily depends on the characteristics of the photo-detector and scanning velocity. Implementation of thin silver layer and coupling of incident radiation into Surface Plasmons Polaritons (SPP) improves system sensitivity and reduces photo detector dynamic range requirements.

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“…Another early method of nano-imaging is the near-field scanning optical microscope (NSOM or SNOM) [15–18]. This device is practically similar to an atomic force microscope (AFM) in that a sharp probe tip is mechanically scanned across a surface while maintaining contact (or a very small gap of < 100 nm) with the surface.…”

Section: Introductionmentioning

confidence: 99%

Nano-imaging enabled via self-assembly

McLeod

Ozcan

2014

Nano Today

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SUMMARY Imaging object details with length scales below approximately 200 nm has been historically difficult for conventional microscope objective lenses because of their inability to resolve features smaller than one-half the optical wavelength. Here we review some of the recent approaches to surpass this limit by harnessing self-assembly as a fabrication mechanism. Self-assembly can be used to form individual nano- and micro-lenses, as well as to form extended arrays of such lenses. These lenses have been shown to enable imaging with resolutions as small as 50 nm half-pitch using visible light, which is well below the Abbe diffraction limit. Furthermore, self-assembled nano-lenses can be used to boost contrast and signal levels from small nano-particles, enabling them to be detected relative to background noise. Finally, alternative nano-imaging applications of self-assembly are discussed, including three-dimensional imaging, enhanced coupling from light-emitting diodes, and the fabrication of contrast agents such as quantum dots and nanoparticles.

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Differential Near-Field Scanning Optical Microscopy Using Sensor Arrays

Cited by 9 publications

References 44 publications

Toward giga-pixel nanoscopy on a chip: a computational wide-field look at the nano-scale without the use of lenses

Toward giga-pixel nanoscopy on a chip: a computational wide-field look at the nano-scale without the use of lenses

Evanescent field scanning optical microscopy

Nano-imaging enabled via self-assembly

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