2006
DOI: 10.21608/ejs.2006.149278
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Dielectric Relaxation in CdxInSe9-x Chalcogenide Thin Films

Abstract: The effect of temperature (273-493 K), frequency (10 2-10 5 Hz) and composition on the dielectric response of the Cd x InSe 9-x (x= 1,2,3,4 and 5) Chalcogenide glass system was studied. The experimental results indicate that dielectric constant (real permittivity), dielectric loss and loss angle έ, ε '' and tan δ, increase with increasing temperature. The complex impedance (Z) was measured over the same temperature and frequency ranges. All samples gave a semicircle arc originating at the origin point. This in… Show more

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Cited by 12 publications
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