2012
DOI: 10.1016/j.matlet.2012.07.007
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Dielectric anomaly and magnetic properties of multiferroic GaFe0.75Mn0.25O3

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Cited by 16 publications
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“…Thus, substitution of 3d magnetic elements is expected to effectively control and expand the magnetic and dielectric properties in GaFeO 3 -type oxides. Indeed, magnetic element substitutions such as Cr, Mn, and Co for nonmagnetic Ga enhance T C of GaFeO 3 . However, the maximum substitution content x in Ga 1– x M x FeO 3 (M = Cr, Mn, and Co) has been limited to 0.1, and the substitution effect on ferroelectricity has not been investigated. To realize a large amount of substitution and ferroelectric measurements, an epitaxial thin-film growth technique is useful because interfacial strain due to a lattice mismatch between the film and the substrate enables stabilization of the metastable phase and control of the polarization orientation in out-of-plane direction.…”
Section: Introductionmentioning
confidence: 99%
“…Thus, substitution of 3d magnetic elements is expected to effectively control and expand the magnetic and dielectric properties in GaFeO 3 -type oxides. Indeed, magnetic element substitutions such as Cr, Mn, and Co for nonmagnetic Ga enhance T C of GaFeO 3 . However, the maximum substitution content x in Ga 1– x M x FeO 3 (M = Cr, Mn, and Co) has been limited to 0.1, and the substitution effect on ferroelectricity has not been investigated. To realize a large amount of substitution and ferroelectric measurements, an epitaxial thin-film growth technique is useful because interfacial strain due to a lattice mismatch between the film and the substrate enables stabilization of the metastable phase and control of the polarization orientation in out-of-plane direction.…”
Section: Introductionmentioning
confidence: 99%