2016
DOI: 10.1109/tcsi.2016.2615108
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Device Modelling for Bendable Piezoelectric FET-Based Touch Sensing System

Abstract: Device modelling for bendable piezoelectric FET-based touch sensing system.Abstract-Flexible electronics is rapidly evolving towards devices and circuits to enable numerous new applications. The high-performance, in terms of response speed, uniformity and reliability, remains a sticking point. The potential solutions for high-performance related challenges bring us back to the timetested silicon based electronics. However, the changes in the response of silicon based devices due to bending related stresses is … Show more

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Cited by 37 publications
(27 citation statements)
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References 45 publications
(57 reference statements)
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“…For example, with requirement of bendability in e-skin, the conformable electronics has also advanced and have opened opportunities for developing predictive, and accurate models for flexible devices, which could be exploited to predict the bending state or stress patterns. This is because device response changes constructively of destructively as a result of bending induced stresses [35][36][37].…”
Section: Challenges and Opportunitiesmentioning
confidence: 99%
“…For example, with requirement of bendability in e-skin, the conformable electronics has also advanced and have opened opportunities for developing predictive, and accurate models for flexible devices, which could be exploited to predict the bending state or stress patterns. This is because device response changes constructively of destructively as a result of bending induced stresses [35][36][37].…”
Section: Challenges and Opportunitiesmentioning
confidence: 99%
“…This is unlike conventional MOSFET, where bending induced variations are clearly observable [14,18] The output characteristics of the GFET for Vgs(back) = 40V and Vgs(top) = -1.8V is depicted in Fig. 4.…”
Section: Bending Effect On Gfetmentioning
confidence: 97%
“…al [13]. The proposed model has been implemented in Verilog-A, which is widely used for circuit modelling [14,15]. This paper is organised as follows: Section II presents the transistor layout of the modelled GFET device.…”
Section: Introductionmentioning
confidence: 99%
“…Pins Vbias, G', G, B, S, D stands for the top electrode bias voltage, the connection towards the gate of the transistor, the bulk, gate, source and drain of strained transistor, respectively. Terminal F is for force-dependent voltage source connected to a dummy transistor [21].…”
Section: Modelling and Validationmentioning
confidence: 99%