A variety of optical probe techniques that use light in the near-ultraviolet to near-infrared range can provide useful information about the physical properties of the surfaces and interfaces of electronic materials. Purely optical techniques (i.e., photon excitation and detection) include reflectance, ellipsometry, and Raman spectroscopy. Optical techniques that induce electrical changes include photocurrent and photovoltage spectroscopies. Conversely, electron excitation that induces optical emission can provide information specific to surfaces as well as interfaces below the surface.Optical spectroscopies are advantaged in terms of their high energy precision both for excitation and detection, their non-destructive nature, and their ability to provide in situ or remote sensing. However, an inherent disadvantage of purely optical spectroscopies is their low surface sensitivity. This chapter reviews these various techniques, how they take advantage of different physical phenomena to achieve surface sensitivity, and the surface and interface information they can provide.Here, is the radiation angular frequency, is the optical wavelength, ( ) is the frequency-dependent imaginary part and ( ) is the real part of the complex refractive An Essential Guide to Electronic Material Surfaces and Interfaces, First Edition. Leonard J. Brillson.