2011
DOI: 10.1063/1.3671994
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Determination of secondary phases in kesterite Cu2ZnSnS4 thin films by x-ray absorption near edge structure analysis

Abstract: Secondary phases in Cu2ZnSnS4 (CZTS) are investigated by x-ray absorption spectroscopy. Evaluating the x-ray absorption near edge structure at the sulfur K-edge, we show that secondary phases exhibit sufficiently distinct features to allow their quantitative determination with high accuracy. We are able to quantify the ZnS fraction with an absolute accuracy of ±3%, by applying linear combination analysis using reference spectra. We find that even in CZTS thin films with [Sn]/[Zn] ≈ 1, a significant amount of Z… Show more

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Cited by 112 publications
(121 citation statements)
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“…The spectra of the binary phases CuS, ZnS, and SnS as well as that of CZTS are depicted in Figure 6. As already shown in [7] the spectra significantly differ from each other. Therefore it is possible to identify secondary phases in CZTS samples.…”
Section: Chemical Composition and Phase Puritymentioning
confidence: 50%
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“…The spectra of the binary phases CuS, ZnS, and SnS as well as that of CZTS are depicted in Figure 6. As already shown in [7] the spectra significantly differ from each other. Therefore it is possible to identify secondary phases in CZTS samples.…”
Section: Chemical Composition and Phase Puritymentioning
confidence: 50%
“…Finally the integral chemical composition can be calculated as Furthermore, phase purity was investigated by XANES. As explained in [7], X-ray absorption near edge structure analysis at the sulfur K-edge (2472 eV) gives information about the chemical environment of the selected atom, in this case sulfur, the electronic density of the unoccupied states, and the local crystal structure. It can be considered as a fingerprint for the identification of different materials [33].…”
Section: Chemical Composition and Phase Puritymentioning
confidence: 99%
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