The performance of perovskite solar cells (PSCs) is predominantly limited by non-radiative recombination, either through trap-assisted recombination in the absorber layer or via minority carrier recombination at the perovskite/transport layer interfaces. Here we use transient and absolute photoluminescence imaging to visualize all non-radiative recombination pathways in planar pin-type PSCs with undoped organic charge transporting layers. We find significant quasi-Fermi level splitting losses (135 meV) in the perovskite bulk, while interfacial recombination results in an additional free energy loss of 80 meV at each individual interface which limits the open-circuit voltage ( OC ) of the complete cell to ~1.12 V. Inserting ultrathin interlayers between the perovskite and transport layers allows substantial reduction of these interfacial losses at both the p and n contacts. Using this knowledge and approach, we demonstrate reproducible dopant-free 1 cm 2 PSCs surpassing 20% efficiency (19.83% certified) with stabilized power output, a high OC (1.17 V) and record fill factor (> 81%).
We introduce new hole-selective contacts for next-generation perovskite photovoltaics and point to design paths for molecular engineering of perfect interfaces.
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