Determination of optical constants of thin films from transmittance trace

Bhattacharyya, Souvik; Gayen, R.N.; Paul, Rajib; Pal, A.K.

doi:10.1016/j.tsf.2009.03.168

Cited by 54 publications

(28 citation statements)

References 27 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…The details of this method and successful overcoming of the difficulties of simultaneous determination of the optical constants of transparent thin film and its thickness were presented in the publication [21] and references therein.…”

Section: Optical Measurementsmentioning

confidence: 99%

Synthesis and characterization of boron antimonide films by pulsed laser deposition technique

Das

Bhunia

Hussain

et al. 2015

Applied Surface Science

Self Cite

View full text Add to dashboard Cite

Section: Optical Measurementsmentioning

confidence: 99%

Synthesis and characterization of boron antimonide films by pulsed laser deposition technique

Das

Bhunia

Hussain

et al. 2015

Applied Surface Science

Self Cite

View full text Add to dashboard Cite

“…Bhattacharya et al applied such an envelope-free approach to the study of films of Zn 1Àx Mg x O with good success, but could do so only upon dividing the spectra into arbitrary regions. 5 In the present work, we employed a strategy that combines aspects of full spectrum fitting and envelope treatment and is free of arbitrary definitions of absorption regions. The index of refraction, n(k), is assumed to behave according to the Sellmeier equation,…”

Section: Methodsmentioning

confidence: 99%

Determination of optical and microstructural parameters of ceria films

Oh¹,

Tokpanov²,

Hao³

et al. 2012

Journal of Applied Physics

View full text Add to dashboard Cite

Optimization of Nb2O5/Ag/Nb2O5 multilayers as transparent composite electrode on flexible substrate with high figure of merit J. Appl. Phys. 112, 103113 (2012) Modulation of external electric field on surface states of topological insulator Bi2Se3 thin films Appl. Phys. Lett. 101, 223109 (2012) Ultra-thin perfect absorber employing a tunable phase change material Appl. Phys. Lett. 101, 221101 (2012) Optical properties of Mg-doped VO2: Absorption measurements and hybrid functional calculations Appl. Phys. Lett. 101, 201902 (2012) Additional information on J. Appl. Phys. Light-matter interactions are of tremendous importance in a wide range of fields from solar energy conversion to photonics. Here the optical dispersion behavior of undoped and 20 mol. % Sm doped ceria thin films, both dense and porous, were evaluated by UV-Vis optical transmission measurements, with the objective of determining both intrinsic and microstructural properties of the films. Films, ranging from 14 to 2300 nm in thickness, were grown on single crystal YSZ(100) and MgO(100) using pulsed laser deposition (both dense and porous films) and chemical vapor deposition (porous films only). The transmittance spectra were analyzed using an in-house developed methodology combining full spectrum fitting and envelope treatment. The index of refraction of ceria was found to fall between 2.65 at a wavelength of 400 nm and 2.25 at 800 nm, typical of literature values, and was relatively unchanged by doping. Reliable determination of film thickness, porosity, and roughness was possible for films with thickness ranging from 500 to 2500 nm. Physically meaningful microstructural parameters were extracted even for films so thin as to show no interference fringes at all. V C 2012 American Institute of Physics.

show abstract

“…Now, the relation between the band gap (E g ) and the effective mass is given by the following equation: [62][63][64][65] 1/m…”

Section: Optical Studiesmentioning

confidence: 99%

Structural and Optical Properties of Manganese‐Doped NanocrystallineZinc Oxide/Polyvinylidene Fluoride Flexible Composite Thin Films Deposited by the Sol–Gel Method

et al. 2016

View full text Add to dashboard Cite

Mn-doped nanocrystalline ZnO (Mn x Zn 1-x O) was incorporated in the polyvinylidene fluoride thin film for obtaining the free-standing flexible film by the sol-gel technique. The effect of Mn-ZnO loading on the optical and microstructural properties of the Mn-ZnO/polyvinylidene fluoride (PVDF) composite films was studied critically for the as-deposited and the poled samples. X-ray photoelectron spectroscopy (XPS) and Raman spectroscopy were carried out to study the bonding environment. The XPS spectra recorded for poled samples from the fluorine-terminated surface showed a very strong peak at ß695 eV for F1s arising due to C-F bonds. Raman studies showed the presence of the predominant β phase of PVDF in the sample. Peaks related to ZnO nanocrystals were also observed in the Raman spectra. Photoluminescence spectra indicated a strong emission band at ß2.79 eV in the ultraviolet region arising out of near band edge emission of free excitons. C

show abstract

Determination of optical constants of thin films from transmittance trace

Cited by 54 publications

References 27 publications

Synthesis and characterization of boron antimonide films by pulsed laser deposition technique

Synthesis and characterization of boron antimonide films by pulsed laser deposition technique

Determination of optical and microstructural parameters of ceria films

Structural and Optical Properties of Manganese‐Doped NanocrystallineZinc Oxide/Polyvinylidene Fluoride Flexible Composite Thin Films Deposited by the Sol–Gel Method

Contact Info

Product

Resources

About