Determination of optical and microstructural parameters of ceria films

Abstract

Optimization of Nb2O5/Ag/Nb2O5 multilayers as transparent composite electrode on flexible substrate with high figure of merit J. Appl. Phys. 112, 103113 (2012) Modulation of external electric field on surface states of topological insulator Bi2Se3 thin films Appl. Phys. Lett. 101, 223109 (2012) Ultra-thin perfect absorber employing a tunable phase change material Appl. Phys. Lett. 101, 221101 (2012) Optical properties of Mg-doped VO2: Absorption measurements and hybrid functional calculations Appl. Phys. Lett. 101, 201902 (2012) Additional information on J. Appl. Phys. Light-matter interactions are of tremendous importance in a wide range of fields from solar energy conversion to photonics. Here the optical dispersion behavior of undoped and 20 mol. % Sm doped ceria thin films, both dense and porous, were evaluated by UV-Vis optical transmission measurements, with the objective of determining both intrinsic and microstructural properties of the films. Films, ranging from 14 to 2300 nm in thickness, were grown on single crystal YSZ(100) and MgO(100) using pulsed laser deposition (both dense and porous films) and chemical vapor deposition (porous films only). The transmittance spectra were analyzed using an in-house developed methodology combining full spectrum fitting and envelope treatment. The index of refraction of ceria was found to fall between 2.65 at a wavelength of 400 nm and 2.25 at 800 nm, typical of literature values, and was relatively unchanged by doping. Reliable determination of film thickness, porosity, and roughness was possible for films with thickness ranging from 500 to 2500 nm. Physically meaningful microstructural parameters were extracted even for films so thin as to show no interference fringes at all. V C 2012 American Institute of Physics.

Comparison of the heat-treatment effect on carrier dynamics in TiO2 thin films deposited by different methods

“…The steady state spectra of the samples can be analysed to reveal the film thickness and porosity. The interference of the monitoring light reflected from the front and back film surface results in a specific spectral features which depend on the film refractive index and thickness 30,31 . These features are most pronounced when the film thickness is in the order of magnitude of the monitoring wavelength, but can be applied to thinner films, though with lower accuracy.…”

Diffusion of Cation Impurities through Ceria Grain Boundaries

“…The procedure of PLD deposition was optimized for CeO 2 thin film and well described in previous research. [ 26,44 ] After the deposition step, all of the samples were annealed in air at 700 °C for 10 h using a tube furnace.…”

Thin Coatings of Cerium Oxide Nanoparticles with Anti-Reflective Properties

“…The optimisation approach requires knowledge of the refractive indexn NP of CeO 2 nanoparticles, their packing density φ c inside the coating (1 − φ c being the void fraction or porosity), and the thickness of the coating h. We then compute the ellipsometric angles of the coating with a refractive index calculated via the Bruggeman effective-medium approximation [27] of a flat nano-porous film with no roughness and deposited of a semi-infinite silicon substrate with an oxidized top surface, namely a 2 nm thick silica layer.…”