2013
DOI: 10.1007/s00339-013-7571-0
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Determination of free-carrier and phonon-assisted absorptions for Si-doped GaSb thin layers

Abstract: International audiencePhotothermal deflection spectroscopy is used in order to investigate near- and sub-band gap absorption of Si-doped GaSb epilayers deposited by MBE on a semi-insulating GaAs substrate. The optical absorption spectra show an extra absorption on the transparency region below the bandgap due to free-carrier absorption. However, for energies above the gap, we notice a linear behavior of the square root of the absorption coefficient versus the heating beam energy, which is attributed to phonon-… Show more

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