Determination of allowable defect size in multimode polymer waveguides fabricated by printed circuit board compatible processes

Abstract

We have investigated the defects observed in the multimode waveguide fabricated on the flexible copper clad laminate using vacuum lamination of film-type raw material, UV exposure and development processes. The excess loss caused by the defects was estimated using the simulation method and the estimated values were found to be well matched with the measured ones except the trapped void type defect which gives excess loss larger than 1 dB by a single defect. From these results, we proposed how the allowable defect size can be determined using the visual inspection system.

Optimization approach for the simultaneous reconstruction of the dielectric permittivity and magnetic permeability functions from limited observations

“…Potential applications of our algorithm are in reconstructing the electromagnetic parameters in nanocomposites or artificial materials [45,47,48], imaging of defects and their sizes in a non-destructive testing of materials and in photonic crystals [15], measurement of the moisture content [14] and drying processes [38], for example.…”