Detailed SET Measurement and Characterization of a 65 nm Bulk Technology

Investigation of Heavy-Ion Induced Single-Event Transient in 28 nm Bulk Inverter Chain

“…In Figure 6, the measured cross section for transients is plotted as the function of LET. Compared with the case [6] reported at 65 nm process, the SET cross section is smaller in 28 nm process, which is due to the smaller sensitive volume. When LET is more than 13.4 MeV · cm 2 · mg −1 , the cross-section of 65 nm process is more than an order of magnitude larger than 28 nm process, because of the reduction in sensitive volume.…”

“…Experimental results show that the measurement threshold and resolution of this pulse measurement circuit are improved compared to similar measurement circuits in the 65 nm process, but still cannot fully contain pulses with smaller widths. Three types of measurement circuits are compared in Reference [6], the measurement structure which is called "Vernier" makes its resolution not directly limited by the combination gate delay, which should be a feasible solution in advanced technology.…”

“…On the basis of this method, Huang et al [8] proposed a structure that can simultaneously measure multiple transient pulses, using eight capture circuits to share a self-trigger structure design, which can measure the SEMT. This improvement has also been widely used by researchers [6,10,18].…”

“…As process feature sizes continue to shrink, clock frequencies continue to increase, node capacitance and supply voltage decrease, the critical charge of transient pulses is reduced [3][4][5], and waveforms are more easily captured and soft errors are formed. It has been reported that SET are the main cause of soft errors in space applications [6,7], and charge sharing may even affect multiple nodes and cause single-event multiple transients (SEMT) [8][9][10]. These problems are already common in combinatorial logic circuits.…”

“…These problems are already common in combinatorial logic circuits. The impact of SET has attracted a lot of attention, but its characterization is complicated because the cross section and pulse width must be measured simultaneously [6]. There have been many experimental studies on SET.…”