2012
DOI: 10.1016/j.actamat.2012.06.049
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Designing superhard, self-toughening CrAlN coatings through grain boundary engineering

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Cited by 114 publications
(56 citation statements)
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“…The XTEM method was used to observe the factors influencing the mechanical properties of CrSiN coatings with the progressive addition of Si-content while XPS and nanoindentation methods elucidated the surface chemical composition and physical hardness, elastic modulus and residual stress, respectively. Grazing incidence X-ray diffraction (GIXRD) patterns of CrN coatings had been reported to be unaffected with the Al-doping [38]. Undoped samples and samples doped with low, medium and high amounts of Al were identified to be cubic structure; however, other studies reported the existence of wurtzite structure of CrN with Al-doping.…”
Section: Structural Characterization Of Crsin and Craln Thin Film Coamentioning
confidence: 94%
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“…The XTEM method was used to observe the factors influencing the mechanical properties of CrSiN coatings with the progressive addition of Si-content while XPS and nanoindentation methods elucidated the surface chemical composition and physical hardness, elastic modulus and residual stress, respectively. Grazing incidence X-ray diffraction (GIXRD) patterns of CrN coatings had been reported to be unaffected with the Al-doping [38]. Undoped samples and samples doped with low, medium and high amounts of Al were identified to be cubic structure; however, other studies reported the existence of wurtzite structure of CrN with Al-doping.…”
Section: Structural Characterization Of Crsin and Craln Thin Film Coamentioning
confidence: 94%
“…Undoped samples and samples doped with low, medium and high amounts of Al were identified to be cubic structure; however, other studies reported the existence of wurtzite structure of CrN with Al-doping. XPS study [38] found the existence of an amorphous phase of AlN at the grain boundaries. Preferred orientations have been found to be altered by the Al-substitutions.…”
Section: Structural Characterization Of Crsin and Craln Thin Film Coamentioning
confidence: 99%
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