“…The combination of low divergence, small source size and brightness have been utilised to good effect in recent years to extend the capabilities of FTIR-microscopy. 13,[17][18][19][20][21][22] These features couple to improve the spatial resolution and increase the SNR of low étendue measurements. In conventional infrared spectroscopy applications, where étendue is not limited to a particularly low value, the cross-over point below which the synchrotron source delivers more light than a conventional source is in the far-infrared (ca.…”