Fourier transform infrared microscopy: some advances in techniques for characterisation and structure–property elucidations of industrial material†

Chalmers, John M.; Everall, Neil; Hewitson, Karen; Chesters, M.A.; Pearson, M.; Grady, Andrew S.; Ruzicka, Barbara

doi:10.1039/a707070e

Cited by 44 publications

(26 citation statements)

References 24 publications

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“…Thus, it was necessary for commercial instruments using the Javelin detector to use step-scan interferometers, although some rapid-scan experiments using high undersampling rates were performed [65,66]. The development of this ''Javelin camera'' based imaging system initiated a second wave of imaging applications development [67][68][69][70], including the first imaging kinetics studies by Koenig [71][72][73].…”

Section: The ''Javelin'' Mct Cameramentioning

confidence: 99%

FT‐IR Imaging Hardware

Sellors

Hoult

Crocombe

et al. 2010

Raman, Infrared, and Near‐Infrared Chemical Imaging

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The combination of IR spectroscopy with visible microscopy has been used in a wide range of analytical applications for more than 20 years. More recently, however, IR microspectroscopy has benefited from developments in IR detector arrays leading to a marked growth in FT-IR imaging technologies and applications. It is now a fairly simple task to obtain a high-quality IR spectrum from a sample region of around 20 mm in matter of seconds, and the ability to collect full IR images containing hundreds of thousands of pixels, where every image pixel contains a full range IR spectrum, is now available in many hundreds of laboratories worldwide. IR imaging hardware is not yet mature, but despite this, with today's state-of-the-art FT-IR imaging systems, the analysis time for many applications is limited not by the speed at which quality images are obtained, but by the data analysis or sample preparation techniques at the disposal of the operator.Progress in commercial FT-IR imaging hardware development comes from various drivers, but two are particularly relevant: (a) the high popularity of single point IR microscopy systems that has fuelled the interest in technology and applications utilizing more rapid methods of data acquisition and (b) the development of multichannel array detectors that operate in the mid-infrared region for nonspectroscopic applications. These are fundamental to both the understanding of current FT-IR imaging technologies and probable developments in the near future. Developments in IR Microscopy and Imaging SystemsInterest in obtaining IR spectra from small samples goes back to over 60 years; for example, a reported study of the structure of penicillin by Thomson [1] in the late 1940s used a prismbased dispersive spectrometer coupled with a beam condenser/microscope system. A commercial IR microscope system described in 1953 by Coates et al. [2] demonstrated quite respectable IR spectra from single fiber samples of less than 20 mm in diameter, recorded with 15 min scan times, and contained some design attributes that are still present in today's systems. However, it was not until early 1980s when the rapid uptake of commercial FT-IR systems and applications such as semiconductor microanalysis provided both the applications and technology interest to spur the growth in IR microspectroscopy. Today, all major manufacturers of laboratory FT-IR spectrometers include IR microscopes, some with automated point mapping systems, as well as imaging systems in their product portfolios.Early (1980s) FT-IR microscope systems were mostly bolt-on accessories derived from optical microscope frames that were modified to support the collection of IR spectra from selected regions of interest (ROI). Later, systems were Raman, Infrared, and Near-Infrared Chemical Imaging Edited by Slobodan Š ašić and Yukihiro Ozaki

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Section: The ''Javelin'' Mct Cameramentioning

confidence: 99%

FT‐IR Imaging Hardware

Sellors

Hoult

Crocombe

et al. 2010

Raman, Infrared, and Near‐Infrared Chemical Imaging

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show abstract

“…Although it can be considered in many laboratories as a routine analytical method, the combination of the advantages and disadvantages of microscopic analysis with those of each spectroscopic method give rise to a series of conditioning factors which can have important repercussions depending on the type of material under study. The study of polymeric materials by vibrational microscopy is well documented in the literature [32][33][34][35][36][37][38], however, it is convenient to highlight some of the more important features with respect to TLCPs.…”

Section: Practical Considerationsmentioning

confidence: 99%

“…With FTIR microscopy using a synchrotron radiation source spectra have been recorded from polymeric materials at spatial resolutions below the diffraction limit [38,51]. Perhaps the most spectacular advances have been achieved in coupling vibrational spectroscopy to near-field optical microscopy (NFOM) experiments.…”

Section: Domain Size and Distributionmentioning

confidence: 99%

Practical considerations in the study of main-chain thermotropic liquid-crystalline polymers by vibrational microscopy

Ellis¹,

Gómez²,

Cavazzini³

2000

Analusis

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“…Because one is limited by the signal-to-noise available within the generated absorption index spectrum, the approach favours the more strongly absorbing polymers, such as aromatic polymers. Figure 8(a) shows the absorption index spectra obtained from measurements of the specular reflectance spectra from a series of poly(aryl ether ether ketone), PEEK, plaques of differing crystallinities [10,14]. The spectra show progressive changes in relative absorption band intensities that may be correlated directly with the differing crystallinities.…”

Section: Case Study 3: Specular Reflectance Ftir-microscopy Of Peek Mmentioning

confidence: 99%

FTIR-microscopy as a tool for the measurement of the morphology of industrial, polymeric products

Chalmers¹,

Everall²

2000

Analusis

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Fourier transform infrared microscopy: some advances in techniques for characterisation and structure–property elucidations of industrial material†

Cited by 44 publications

References 24 publications

FT‐IR Imaging Hardware

FT‐IR Imaging Hardware

Practical considerations in the study of main-chain thermotropic liquid-crystalline polymers by vibrational microscopy

FTIR-microscopy as a tool for the measurement of the morphology of industrial, polymeric products

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