1999
DOI: 10.1109/43.811329
|View full text |Cite
|
Sign up to set email alerts
|

Design error diagnosis and correction via test vector simulation

Abstract: Abstract-With the increase in the complexity of digital VLSI circuit design, logic design errors can occur during synthesis. In this paper, we present a test vector simulation-based approach for multiple design error diagnosis and correction. Diagnosis is performed through an implicit enumeration of the erroneous lines in an effort to avoid the exponential explosion of the error space as the number of errors increases. Resynthesis during correction is as little as possible so that most of the engineering effor… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
2
1

Citation Types

2
80
0

Year Published

2007
2007
2022
2022

Publication Types

Select...
6
2

Relationship

0
8

Authors

Journals

citations
Cited by 93 publications
(82 citation statements)
references
References 39 publications
2
80
0
Order By: Relevance
“…Debugging techniques relying on simulation [7]- [10] and BDDs [7], [11] were among the earliest. These solutions perform well under certain conditions but the size of modern designs poses a challenge in their ability to scale.…”
Section: A Simulation and Bdd-based Techniquesmentioning
confidence: 99%
“…Debugging techniques relying on simulation [7]- [10] and BDDs [7], [11] were among the earliest. These solutions perform well under certain conditions but the size of modern designs poses a challenge in their ability to scale.…”
Section: A Simulation and Bdd-based Techniquesmentioning
confidence: 99%
“…Afterwards, an affect analysis is performed based on path tracing [1], i.e., a path from an observed faulty behavior at an observation point to the primary inputs is computed [21]. The path is extracted by following the controlling values, i.e., the operations that are responsible for the current value at the observation point v f aulty (OP i ).…”
Section: Dynamic Analysismentioning
confidence: 99%
“…All nodes on the sensitive path from any observation point are potential fault candidates. Like for the static analysis, either the intersection or the union is computed for all sensitive paths while assuming single faults or multiple faults, respectively [21].…”
Section: Dynamic Analysismentioning
confidence: 99%
See 1 more Smart Citation
“…However, fixing errors via resynthesis remains challenging because existing techniques lack the scalability to handle the global implications of the logic modifications imposed by error correction. As a result, state-of-art techniques often limit the types of errors that can be corrected [8] or operate only on small circuits [7], [10].…”
Section: Introductionmentioning
confidence: 99%