Depth resolved ion beam analysis of objects of art

Differential and scanning-mode external PIXE for the analysis of the painting “Ritratto Trivulzio” by Antonello da Messina

“…Groups with different scientific expertise were thus involved in an extensive campaign of preliminary investigations, in the framework of which our laboratory was asked to characterise materials and painting techniques through Ion Beam Analysis. Indeed, IBA had already proven to be effective in providing crucial information about composition and structure of paint layers in a fully non-destructive way [1][2][3][4][5][6].…”

X-rays for Archaeology

“…Backscattered protons are detected at 135 using a Silicon Surface Barrier detector. Gamma-rays were detected using an HPGe detector of 60% relative efficiency [Neelmeijer C., 1996]. …”

3D Micro-PIXE at atmospheric pressure: A new tool for the investigation of art and archaeological objects

“…The strong dependence of the X-ray ionization cross-section on the proton energy and thus with the depth at which the X-ray production takes place, as well as, the capability of protons to penetrate (depending on the matrix and beam energy) deeper in matter relatively to other ions, are the fundamental physical properties that have initiated the development of the differential PIXE analysis since 1995. Various experimental strategies have been developed so far by different groups, in particular for painting materials [2][3][4][5][6][7][8][9]. They all have in common that either the energy or even the angle of the impinging proton beam has to be changed.…”