“…Under the conditions employed in the present study (450 °C for 1 h), the plasma, nitriding and oxidation treatments applied to Ti were able to bombard the surface with nitrogen and oxygen ions, respectively. Thus, some Ti atoms were removed when reacting with N and O from the plasma and became available on the material surface, in the form of nitrides and oxides [36,37]; however, the films produced by the treatments were very thin, with magnitudes in the order of nanometers, estimated by the difference in peak intensity for different incidence angles in GIXRD, which could not be perceived using conventional Xray diffraction analysis (Bragg -Brentano configuration). Therefore, the GIXRD technique was applied, which, due to the small depth of beam penetration in the deposited layer, provided information on the treatment diffusion profile.…”