2010
DOI: 10.1143/jjap.49.035801
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Deposition of Amorphous Zinc Indium Tin Oxide and Indium Tin Oxide Films on Flexible Poly(ether sulfone) Substrate Using RF Magnetron Co-sputtering System

Abstract: Zn–In–Sn-O (ZITO) and In–Sn-O (ITO) thin films were deposited at room temperature on poly(ether sulfone) (PES) substrates using a combinatorial rf magnetron co-sputtering system. The cationic contents of the films were varied using a compositionally combinatorial technique. The average optical transmittance of the ZITO films was >80% in the visible region. The ZITO films showed an amorphous phase regardless of the zinc content. A minimum resistivity of 4.1×10-4 Ω·cm was obtained at a zinc content of 8.9 at.… Show more

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Cited by 10 publications
(7 citation statements)
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“…The TFT uses a high-mobility channel material with a composition of In-Sn-Zn-O (ITZO). ITZO has been investigated as a candidate channel material for the backplane of AMOLED displays, [6][7][8][9] but the composition was optimized to realize higher mobility and higher reliability.…”
Section: Introductionmentioning
confidence: 99%
“…The TFT uses a high-mobility channel material with a composition of In-Sn-Zn-O (ITZO). ITZO has been investigated as a candidate channel material for the backplane of AMOLED displays, [6][7][8][9] but the composition was optimized to realize higher mobility and higher reliability.…”
Section: Introductionmentioning
confidence: 99%
“…202 The samples were deposited from a pure ZnO target and an In 2 O 3 target doped with 10 wt. % Sn.…”
mentioning
confidence: 99%
“…This ZITO crystallization was similar to an amorphous structure of previous literature that may be applied in transistors. 12) Although this ZITO crystallization possessed an amorphous characteristic, but its electrical properties was not suitable for active layer of transistors (Table 1). To achieve the semiconductor characteristic, the ZITO film contained 69 at% of Zn (RF power: 80 W, DC power: 30 W) was selected to adjust the resistivity under the different oxygen concentrations.…”
Section: Structural and Electrical Characteristics Of Zitomentioning
confidence: 99%