2021
DOI: 10.1103/physrevmaterials.5.064606
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Dependence of the electronic structure of the EuS/InAs interface on the bonding configuration

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Cited by 16 publications
(26 citation statements)
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References 62 publications
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“…The calculated magnetic moment, μ eff /Eu, was 6.93 μB and μ eff /Eu was found to be 6.9 μ B throughout the EuS/Bi 2 Se 3 film [ 14 ]. Similar to the EuS/InAs film, the magnetic part was mostly concentrated in the EuS thin film with a restriction of the Eu moment in the EuS layer closest to the InAs [ 32 ].…”
Section: Resultsmentioning
confidence: 99%
“…The calculated magnetic moment, μ eff /Eu, was 6.93 μB and μ eff /Eu was found to be 6.9 μ B throughout the EuS/Bi 2 Se 3 film [ 14 ]. Similar to the EuS/InAs film, the magnetic part was mostly concentrated in the EuS thin film with a restriction of the Eu moment in the EuS layer closest to the InAs [ 32 ].…”
Section: Resultsmentioning
confidence: 99%
“…Once the interface configuration was optimized, the thickness of each material was increased until conver-gence of the electronic properties was achieved. 47 atomic layers of the semiconductor were used, based on previous band gap convergence studies [29,110,111]. The Heusler thickness was converged with respect to the density of states and magnetic moment, which should approach the bulk limit at the center of the slab [98].…”
Section: Resultsmentioning
confidence: 99%
“…The observation of zero bias peaks in this system has sparked an active debate regarding their origin [23][24][25][26][27]. In particular, experimental [28] and computational [29] studies of the EuS/InAs interface have suggested that the proximity-induced magnetic moment in InAs may be too small and too localized to produce sufficiently strong exchange coupling. Exploration of alternatives to EuS may advance the understanding of these proposed mechanisms as they relate to the atomistic structure and electronic properties of the interface and ultimately lead to the discovery of new materials platforms for the realization of MZMs.…”
Section: Introductionmentioning
confidence: 99%
“…These values have been used successfully for various simulations of InAs surfaces and interfaces. [26][27][28] Spin orbit coupling was applied throughout 29 and a dipole correction was applied along the z-axis of the surface. 30 For all self consistent field (SCF) and density of states (DOS) calculations, Γ-centered Monkhorst-Pack k-point grids with densities of 5×5×1, and a cutoff energy of 350 eV were used.…”
Section: Methodsmentioning
confidence: 99%