Defect Oriented Testing for analog/mixed-signal devices

Kruseman, B.; Tasic, B.; Hora, C.; Dohmen, Jos J.; Hashempour, H.; Beurden, M. van; Xing, Yizi

doi:10.1109/test.2011.6139127

Cited by 30 publications

(16 citation statements)

References 17 publications

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“…For the analog blocks, industry does not yet fully adopt automated structured approaches, but often still uses functional testing, resulting in lower fault coverage and more test escapes. It has been shown that typical specification testing of analog blocks offers no guarantee to meet the quality requirements, below the ppm level [2,3].…”

Section: Discussionmentioning

confidence: 99%

Design and test of analog circuits towards sub-ppm level

Gielen

Dobbelaere

Vanhooren

et al. 2014

2014 International Test Conference

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Electronics are increasingly being embedded in a growing number of applications in our daily life. This demands strong reliability and robustness of those electronic systems. The IC manufacturing process not being perfect, however, inevitably results in some fabricated parts having defects. Test methods must detect such faulty ICs before shipment. While the fault coverage of testing for digital integrated circuits in industry today already reaches the sub-ppm level, this is not yet the case for analog integrated circuits or the analog part in mixed-signal ICs. This invited talk will review some techniques that are being explored in industrial practice to aim for sub-ppm-level coverage for the analog and mixed-signal circuits as well. This will be illustrated with some practical examples from automotive IC designs.

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Section: Discussionmentioning

confidence: 99%

Design and test of analog circuits towards sub-ppm level

Gielen

Dobbelaere

Vanhooren

et al. 2014

2014 International Test Conference

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“…The paper also showed that 4X fewer defects could be selected to achieve the same confidence interval if the defects had the realistic range of defect likelihoods reported in [5] -in that case 70% of the defects each had a likelihood of occurrence less than 100 parts per billion, and 10% of the defects each had a likelihood ranging from 0.5 to 20 parts per million.…”

Section: Likelihood-weighted Random Samplingmentioning

confidence: 94%

“…1. However, in [5], the authors show that the range in defect likelihoods in a relatively small mixed-signal IC is definitely not uniform; it is greater than 10000:1. They also state that bridge defects are more likely than opens.…”

Section: Random Sampling For Analog Fault Simulationmentioning

confidence: 96%

Experiences with an industrial analog fault simulator and engineering intuition

Sunter¹

2015

2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW)

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While working with designers and DFT engineers in companies evaluating an "industrial-strength" analog fault simulator, it became apparent that intuition and theory often differ regarding random sampling of defects to simulate. This paper explores these differences. In one case, it was hoped that simulating more defects would increase the estimated coverage. In a second case, it was assumed that pre-simulation analysis of a circuit would more efficiently reveal defects that need to be simulated. In a third, engineering intuition said at least 1% of all potential defects must be simulated to estimate coverage. In a fourth case, it was thought that fault coverage for portions of a circuit could be gleaned from results for faults randomly injected into the whole circuit. In a fifth, the types of faults injected were assumed to greatly affect coverage. In a last case, intuitively it seemed that improving a test to detect the most-likely defects that were undetected would have the greatest impact on coverage.

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“…The adopted approach in testing follows the tracks of other works applying the Simulate-Before-Test methodology (SBT) like in [13]. On the basis of fault models representing the physical defects and the simulation of their impact on the circuit, useful information is extracted aiming the test of chips after fabrication.…”

Section: Defect-oriented Analog Testingmentioning

confidence: 99%

“…Following the existing dictionary-based methods [13], this methodology proposes the construction of a defect-detection scheme built on the simulation of all possible defects and the recording of specific signatures provoked by the applied inputs. Standard analysis techniques typically opt for the RootMean-Square (RMS) value of transient signals like the output voltage or the current supply to discriminate between fault-free and faulty circuits.…”

Section: Defect-oriented Analog Testingmentioning

confidence: 99%

Optimization of analog fault coverage by exploiting defect-specific masking

Coyette

Gielen

Vanhooren

et al. 2014

2014 19th IEEE European Test Symposium (ETS)

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A new method is presented to detect catastrophic defects from the signal analysis of dynamic current consumption waveforms of analog circuits. While other techniques use the whole information in a Root-Mean-Square computation or in black-box techniques such as a neural network, the central point of this work resides in the selection of waveform samples to create a signature able to discriminate a defective circuit from a fault-free circuit. The selection of samples is implemented by the introduction of binary vectors to partially mask the data. Confronted with process variations, this technique offers the advantage of being straightforward and simple to implement in Automated Test Equipments. The generation of the masks is optimized to improve the defect coverage by means of a genetic algorithm maximizing the distance between the signature of the fault-free circuit and a faulty circuit. Results from simulations on industrial circuits show that the number of detected defects can be nearly doubled for specific stimuli.

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Defect Oriented Testing for analog/mixed-signal devices

Cited by 30 publications

References 17 publications

Design and test of analog circuits towards sub-ppm level

Design and test of analog circuits towards sub-ppm level

Experiences with an industrial analog fault simulator and engineering intuition

Optimization of analog fault coverage by exploiting defect-specific masking

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