17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings.
DOI: 10.1109/dftvs.2002.1173513
|View full text |Cite
|
Sign up to set email alerts
|

Data compression for system-on-chip testing using ATE

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2

Citation Types

0
2
0

Publication Types

Select...
4
2

Relationship

1
5

Authors

Journals

citations
Cited by 9 publications
(2 citation statements)
references
References 12 publications
0
2
0
Order By: Relevance
“…Various methods have thus been proposed for compression of test data Yamaguchi et al, 2002;Karimi et al, 2002). The asymmetry between the decoding and encoding time of the BWT makes it particularly suited for compression under the ATE environment, where very fast and simple decompression is needed, but encoding is only done once, and can be done on a fast system.…”
Section: Test Data Compressionmentioning
confidence: 99%
“…Various methods have thus been proposed for compression of test data Yamaguchi et al, 2002;Karimi et al, 2002). The asymmetry between the decoding and encoding time of the BWT makes it particularly suited for compression under the ATE environment, where very fast and simple decompression is needed, but encoding is only done once, and can be done on a fast system.…”
Section: Test Data Compressionmentioning
confidence: 99%
“…In the compression method that we are using for our architecture (test reuse [9]) the test set is partitioned and the repeated segments of test set are removed. To reduce the amount of test data, this technique removes the data that is left unchanged from one test to another.…”
Section: A Data Compressionmentioning
confidence: 99%