Data acquisition and scan control system for nuclear microprobe and other multiparameter experiments

Bogovać, M.; Bogdanović, Ivančica; Fazinić, Stjepko; Jakšić, Milko; Kukec, L.; Wilhelm, W.

doi:10.1016/0168-583x(94)95176-4

Cited by 55 publications

(19 citation statements)

References 4 publications

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“…Signals were guided through the standard electronic chain which consisted of a charge sensitive preamplifier, a shaping amplifier and an analogue-to-digital multichannel analyzer. Data acquisition was performed on the personal computer by the in-house developed system SPECTOR [6].…”

Section: Samples and Methodsmentioning

confidence: 99%

The evaluation of radiation damage parameter for CVD diamond

Grilj

Skukan

Jakšić

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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There are a few different phenomenological approaches that aim to track the dependence of signal height in irradiated solid state detectors on the fluence of damaging particles. However, none of them are capable to provide a unique radiation hardness parameter that would reflect solely the material capability to withstand high radiation environment. To extract such a parameter for CVD diamond, two different diamond detectors were irradiated by proton beams in MeV energy range and subjected afterwards to IBIC analysis. The change in CCE due to defects produced was investigated in context of a theoretical model that was developed on the basis of the adjoint method for linearization of the continuity equations of electrons and holes. The agreement of theory and measured data resulted with the first known value of the product for diamond. As discussed in the text, this quantity could be considered as a true radiation damage parameter.

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Section: Samples and Methodsmentioning

confidence: 99%

The evaluation of radiation damage parameter for CVD diamond

Grilj

Skukan

Jakšić

et al. 2016

Nuclear Instruments and Methods in Physics Research Section B:

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“…3) produced by FAST ComTec [13]. This system operates in list mode, capturing data octets of up to 13 bits of X, 13 bits of Y and the desired number of digital bits from the energy parameters obtained fiom the separate detectors used for IBA.…”

Section: Data Acquisitionmentioning

confidence: 99%

A new approach to nuclear microscopy: the ion–electron emission microscope

Doyle

Vizkelethy

Walsh

et al. 1999

Nuclear Instruments and Methods in Physics Research Section B:

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A new multidimensional high lateral resolution ion beam analysis technique, Ion-Electron Emission Microscopy or IEEM is described. Using MeV energy ions, IEEM is shown to be capable of Ion Beam Induced Charge Collection (IBICC) measurements in semiconductors. IEEM should also be capable of microscopically and multidimensionally mapping the surface and bulk composition of solids. As such, IIEM has nearly identical capabilities as traditional nuclear microprobe analysis, with the advantage that the ion beam doeszot have to be focused. The technique is based on determining the position where an individual ion enters the surface of the sample by projection secondary electron emission microscopy. The x-y origination point of a secondary electron, and hence the impact coordinates of the corresponding incident ion, is recorded with a position sensitive detector connected to a standard photoemission electron microscope (PEEM). These signals are then used to establish coincidence with IBICC, atomic, or nuclear reaction induced ion beam analysis signals simultaneously caused by the incident ion.

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“…Li and 8 Be having d+α and α+α cluster structure and L = 2. Bound and resonant levels obtained in such a way correspond fairly well to the known low lying states.…”

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confidence: 99%

“…ii) only the well known 8 Be states (0, 3.0, and 11.4 MeV) together with those from 10 Be can contribute to the coincident spectra; iii) the complex nature of the reaction at low energies should be more suitable for the excitation of these special states than some "simple" reactions energy, "position" and energy loss pulses were recorded by a data acquisition system [8].…”

mentioning

confidence: 99%