2019
DOI: 10.1109/tns.2019.2893233
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Dark Count Rate Degradation in CMOS SPADs Exposed to X-Rays and Neutrons

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Cited by 19 publications
(9 citation statements)
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References 43 publications
(17 reference statements)
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“…The DCR trend with respect to Displacement Damage Dose in this device has been deeply investigated in 30 . Previous studies on devices from the same batch, based on X-ray exposures with TID levels up to 1 Mrad, have shown a much lower increase in DCR 38 . Moreover, MOSFET transistors present in front-end electronics, were actually proven to be tolerant to much larger radiation levels than the tens of krad reached during these tests 39 .…”
Section: The Proton Irradiationmentioning
confidence: 73%
“…The DCR trend with respect to Displacement Damage Dose in this device has been deeply investigated in 30 . Previous studies on devices from the same batch, based on X-ray exposures with TID levels up to 1 Mrad, have shown a much lower increase in DCR 38 . Moreover, MOSFET transistors present in front-end electronics, were actually proven to be tolerant to much larger radiation levels than the tens of krad reached during these tests 39 .…”
Section: The Proton Irradiationmentioning
confidence: 73%
“…As expected, the neutron yield of Cu is significantly higher than for the Al target. Moreover, we previously measured a negligible contribution of neutrons with a graphite target, which results from the high energy threshold (20.7 MeV) for the 12 C(p,n) 12 N reaction 44 . Since we aim to establish a scientific methodology for the production of controlled neutron beams with medical cyclotrons, these findings are of paramount importance.…”
Section: Discussionmentioning
confidence: 99%
“…In addition, Jeffries et al characterized the neutron fluence rate during a production of 18 F at a medical cyclotron for evaluating its potential use in neutron damage studies 10 . The neutron-induced damage on materials and electronics is a hot topic for space and avionics, as well as for detectors used in medical and High Energy Physics (HEP) applications [11][12][13][14][15][16][17] .…”
Section: Introductionmentioning
confidence: 99%
“…[1][2][3] As such, applications, like positron emission tomography (PET), fluorescence lifetime imaging, charged particle, tracking and 3D vision focusing on optical signal timing, mostly exploit single-photon detectors. [4][5][6][7] Photo multiplier tubes (PMTs), superconducting single-photon detectors along with single-photon avalanche diodes (SPADs), are well-known single-photon detectors. The continuous improvement of SPAD characteristics has been leading to successful integration of these single-photon detectors in CMOS technologies which makes them very attractive in comparison with other single-photon detectors.…”
Section: Introductionmentioning
confidence: 99%