Damage created in silicon by 1 MeV O+ ions as a function of beam power

scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.

Contact Info

customersupport@researchsolutions.com

10624 S. Eastern Ave., Ste. A-614

Henderson, NV 89052, USA

Blog Terms and Conditions API Terms Privacy Policy Contact Cookie Preferences Do Not Sell or Share My Personal Information

Made with 💙 for researchers

Part of the Research Solutions Family.

Damage created in silicon by 1 MeV O+ ions as a function of beam power

Cited by 6 publications

References 19 publications

Damage production in Si by MeV carbon cluster irradiation

Damage production in Si by MeV carbon cluster irradiation

EPR study of defects produced by MeV Ag ion implantation into silicon

Investigation of deep implanted carbon and oxygen channeling profiles in [1 1 0] silicon, using d-NRA and SEM

Contact Info

Product

Resources

About