2022
DOI: 10.1016/j.solener.2022.01.003
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Damage and residual layer analysis of reactive ion etching textured multi-crystalline silicon wafer for application to solar cells

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Cited by 5 publications
(2 citation statements)
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“…This layer is characterized by dislocations, microcracks, and other structural deformations. The thickness of the damage layer is crucial because it affects the mechanical strength, electrical performance, and overall reliability of the silicon wafer [ 143 ]. Minimizing the surface damage layer thickness is essential to ensuring the production of high-quality and defect-free semiconductor devices.…”
Section: Machining Performance Of Dwsmentioning
confidence: 99%
“…This layer is characterized by dislocations, microcracks, and other structural deformations. The thickness of the damage layer is crucial because it affects the mechanical strength, electrical performance, and overall reliability of the silicon wafer [ 143 ]. Minimizing the surface damage layer thickness is essential to ensuring the production of high-quality and defect-free semiconductor devices.…”
Section: Machining Performance Of Dwsmentioning
confidence: 99%
“…Firstly, the surface area is significantly enhanced as a consequence of needle-like nanostructures inherently increasing the number of dangling bonds at the surface. Secondly, ion-bombardment as a part of dry etching raises the concern of creating crystallographic damage on the surface, which could result in a so-called 'dead-layer' with extensive amount of recombination sites near the surface [16,[32][33][34]. Thirdly, the use of processing gases during dry etching results in chemical residuals on the nanotextured surface [35].…”
Section: Introductionmentioning
confidence: 99%