2015
DOI: 10.1134/s1023193515120095
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Cyclic voltammetry studies of silicon–aluminum thin-film electrodes synthesized in the presence of oxygen

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Cited by 7 publications
(5 citation statements)
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“…However, this is not the case since the mobility of the charge carriers in amorphous silicon is very low and amounts to ∼ 2.0 × 10 −8 m 2 (V•s) −1 at 300 K [26]. This value is comparable to the mobility of lithium ions in Si@O@Al 1.9 × 10 −8 cm 2 /B•c [15], while for the normal operation of the electrode the mobility of the electrons or holes must exceed the mobility of lithium by orders of magnitude. The low mobility of the charge carriers in a-Si is due to the high concentration of structural defects and dangling bonds of silicon atoms.…”
Section: Structure and Electrical Properties Of The Si@o@al Nanocompo...mentioning
confidence: 94%
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“…However, this is not the case since the mobility of the charge carriers in amorphous silicon is very low and amounts to ∼ 2.0 × 10 −8 m 2 (V•s) −1 at 300 K [26]. This value is comparable to the mobility of lithium ions in Si@O@Al 1.9 × 10 −8 cm 2 /B•c [15], while for the normal operation of the electrode the mobility of the electrons or holes must exceed the mobility of lithium by orders of magnitude. The low mobility of the charge carriers in a-Si is due to the high concentration of structural defects and dangling bonds of silicon atoms.…”
Section: Structure and Electrical Properties Of The Si@o@al Nanocompo...mentioning
confidence: 94%
“…These molecular clusters play a very important role in lithium transport, as they increase the area of grain boundaries along which lithium diffusion occurs. In the Si@O@Al nanocomposite, the diffusion coefficient of lithium amounts to 5•10 −10 cm 2 s −1 [15]. It should be clarified that Figure 9 shows different sections of the film, because the areas exposed to the electron beam were etched faster than the neighboring areas, so their repeated study by the SEM method gave a distorted idea of the surface modification by etching.…”
Section: Structure and Electrical Properties Of The Si@o@al Nanocompo...mentioning
confidence: 99%
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