1993
DOI: 10.1016/0022-0248(93)90207-d
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CuAlSe2 chalcopyrite epitaxial layers grown by low-pressure metalorganic chemical vapor deposition

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Cited by 26 publications
(7 citation statements)
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“…Few papers have reported on the epitaxial growth of chalcopyrite semiconductors on ͑110͒ substrates. [7][8][9][10] CuInSe 2 has been grown by flash evaporation 7 on GaAs͑110͒. Igarashi used the halogen transport method to grow CuInSe 2 on ͑110͒ GaAs and GaP 8 and CuGaS 2 on ͑110͒ GaAs.…”
Section: Introductionmentioning
confidence: 99%
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“…Few papers have reported on the epitaxial growth of chalcopyrite semiconductors on ͑110͒ substrates. [7][8][9][10] CuInSe 2 has been grown by flash evaporation 7 on GaAs͑110͒. Igarashi used the halogen transport method to grow CuInSe 2 on ͑110͒ GaAs and GaP 8 and CuGaS 2 on ͑110͒ GaAs.…”
Section: Introductionmentioning
confidence: 99%
“…9 CuAlSe 2 was grown by low-pressure metalorganic chemical vapor deposition on GaAs͑110͒. 10 Most of these studies are about epitaxial relationships. No detailed description of the crystallinity or morphology of the CIGS films grown on ͑110͒ substrates or their optoelectronic properties have been reported.…”
Section: Introductionmentioning
confidence: 99%
“…Mean relative errors [(calc – exp)/exp] in cell parameters compared to averaged experimental data depending on the density functional. Experimental data for ZnO, ZnS, , CdS, ,, CuInS 2 , CuInSe 2 , CuGaSe 2 , CuAlSe 2 , AgInSe 2 , CuGaS 2 , AgAlSe 2 , AgGaSe 2 , CdIn 2 S 4 , CZTSe, diamond, , and quartz. …”
Section: Resultsmentioning
confidence: 99%
“…Black dots mark the average in the experimental literature, and error bars are plotted between the minimum and maximum reported gap values. Experimental data for ZnO, ZnS, , CdS, ,, CuInS 2 , CuInSe 2 , CuGaSe 2 , CuAlSe 2 , AgInSe 2 , CuGaS 2 , AgAlSe 2 , AgGaSe 2 , CdIn 2 S 4 , CZTSe, diamond, , and quartz. .…”
Section: Resultsmentioning
confidence: 99%
“…3. This value is smaller than that of 200 arcsec obtained from the grown epilayer by the MOCVD method [13]. Therefore, it should be noted that the grown epilayers by the HWE method are high quality crystalline.…”
Section: Optimum Growth Condition and Structural Propertiesmentioning
confidence: 91%