2007
DOI: 10.1063/1.2450672
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Crystallization of amorphous silicon by self-propagation of nanoengineered thermites

Abstract: Crystallization of amorphous silicon ͑a-Si͒ thin film occurred by the self-propagation of copper oxide/aluminum thermite nanocomposites. Amorphous Si films were prepared on glass at a temperature of 250°C by plasma enhanced chemical vapor deposition. The platinum heater was patterned on the edge of the substrate and the CuO / Al nanoengineered thermite was spin coated on the substrate that connects the heater and the a-Si film. A voltage source was used to ignite the thermites followed by a piranha solution ͑4… Show more

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Cited by 15 publications
(14 citation statements)
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“…This control results in an inexpensive, fast, and reliable methodology, applied at the industrial level for film fabrication of dielectric, optical and microelectronic materials [28]. Remarkably, however, only a limited number of articles have been published that utilize spin coating to produce binary energetic material films [31][32][33]. While our interest is to produce and investigate such binary fuel-oxidizer energetic materials, this particular paper focuses solely on the effects of drop and spin casting of the oxidizer, given that the oxidizer seems to be most sensitively affected by the conditions of the casting process.…”
Section: Introductionmentioning
confidence: 99%
“…This control results in an inexpensive, fast, and reliable methodology, applied at the industrial level for film fabrication of dielectric, optical and microelectronic materials [28]. Remarkably, however, only a limited number of articles have been published that utilize spin coating to produce binary energetic material films [31][32][33]. While our interest is to produce and investigate such binary fuel-oxidizer energetic materials, this particular paper focuses solely on the effects of drop and spin casting of the oxidizer, given that the oxidizer seems to be most sensitively affected by the conditions of the casting process.…”
Section: Introductionmentioning
confidence: 99%
“…Alumino-thermite is an oxidation-reduction reaction involving am etal (fuel) and am etallic oxide (or possibly an on-metallic oxide) that forms as table product after reaction.Thermite materials have been actively investigated for aw ide range of potential applications including railroad welding, materials processing to form refractory materials, additives in propellants, explosives and pyrotechnics [1][2][3], and more recently also for micro initiation [4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19][20],e nvironmentally clean primers, and in situ welding [21].Among the numerous possible exothermic metal/oxide pairs listed in the literature [22],t he most investigated ones mix Al with MoO 3 ,C uO, Bi 2 O 3 ,F e 2 O 3 ,M nO 2 ,W O 3 ,a nd I 2 O 5 .F or the last two decades most of the research efforts aimed at reducing metal and oxide components size, improving their intimacy,t oi ncrease the reaction rate and decrease the ignition delay while improving safety.More recently,t hermite materials were also considered to produce gas species or pressure bursts, opening new potential fields of application such as pressure mediated molecular delivery [23,24],b iological agent inactivation [25][26][27],h ydrogen production [28,29],o rp ropulsion systems [7][8][9].Af ew teams demonstrated experimentally that Al/Bi 2 O 3 and, to al esser extent, Al/I 2 O 5 mixtures generate the highest pressure pulses [27,30,31] in comparison with other thermites. Martirosyan [31] considered tha...…”
mentioning
confidence: 99%
“…In this case, the calculating average crystalline volume fraction is of no use because of the fluctuating crystallinity region by region in the film. To propagate thermal energy uniformly, the metal layer was introduced between NPH and a-Si as was done in a previous report [10]. On the other hand, to avoid the possibility of forming a silicide layer and metal diffusion through the Si film, a SiO 2 buffer layer was additionally introduced as a diffusion barrier.…”
Section: Resultsmentioning
confidence: 99%
“…Hossain et al [10] reported that a metal buffer layer can act as a heat transporter between NPH and a-Si layers and expedite the crystallization of a-Si. However, the use of metal film as a heat transporting layer may cause serious problemproblems such as forming a metal silicide between metal and silicon, which cannot be removed easily.…”
Section: Introductionmentioning
confidence: 99%
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