2015
DOI: 10.1016/j.nima.2014.11.019
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Cryogenic low noise and low dissipation multiplexing electronics, using HEMT+SiGe ASICs, for the readout of high impedance sensors: New version

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Cited by 6 publications
(3 citation statements)
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“…A production of ASICs based on the 0.35 µm SiGe biCMOS technology from AMS foundry has been delivered and will be tested soon. This technology has demonstrated T = 4.2 K performances [28]. SiGe bipolar transistors will be used for amplification and pMOS/nMOS switches will be used for calibration and reset purposes.…”
Section: Detector + Hemt Noise Modelmentioning
confidence: 99%
“…A production of ASICs based on the 0.35 µm SiGe biCMOS technology from AMS foundry has been delivered and will be tested soon. This technology has demonstrated T = 4.2 K performances [28]. SiGe bipolar transistors will be used for amplification and pMOS/nMOS switches will be used for calibration and reset purposes.…”
Section: Detector + Hemt Noise Modelmentioning
confidence: 99%
“…The quasi-classical multiplexing 34:1 was tested at cold, the noise is 1 nV/ (Hz) @ 1 kHz, at the level of the thermal noise of the sensor, and the foreseen total dissipation is ≈ 6 mW@2.5 K for 4000 pixels. One can find a complete description of this electronics in [2].…”
Section: Cold Electronics For µ-Calorimetersmentioning
confidence: 99%
“…Previously, III-V high electron mobility transistors (HEMTs) have been successfully demonstrated for cryogenic circuit applications [10][11][12][13][14][15][16][17][18][19], which exhibit excellent transistor-like behavior at cryogenic temperature. Unfortunately, the III-V semiconductor technology is incompatible with Si complementary metal-oxidesemiconductor (CMOS) technology and cannot be integrated [20].…”
Section: Introductionmentioning
confidence: 99%