2019
DOI: 10.1039/c8ta11782a
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Critical roles of potassium in charge-carrier balance and diffusion induced defect passivation for efficient inverted perovskite solar cells

Abstract: Critical roles of potassium in charge-carrier balance and diffusion induced defect passivation for highly efficient inverted PSCs are revealed.

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Cited by 67 publications
(58 citation statements)
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“…Enlarged grains with reduced density of grain boundaries and defects in the perovskite lms can effectively improve the device performance. 27,29 XRD patterns reveal the phase compositions and crystallinities of the perovskite lms on different ETLs. As shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…Enlarged grains with reduced density of grain boundaries and defects in the perovskite lms can effectively improve the device performance. 27,29 XRD patterns reveal the phase compositions and crystallinities of the perovskite lms on different ETLs. As shown in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…However, despite the difference in size, which is an important factor in aliovalent replacement, the introduction of both Li and Cs with a 1–10% atomic concentration in NiO is reported to be beneficial for PSCs performances, pointing toward different mechanisms beneficially acting on NiO's hole selectivity. Following this, other alkali elements should also be suitable, with K and Rb demonstrated recently.…”
Section: Introductionmentioning
confidence: 99%
“…[16][17][18] However,t oo ur knowledge, the majority of recentw ork has focusedo nd oping NiOt of urtheri mprovei ts intrinsicc onductivity for betterd evicep erformance. [19][20][21][22][23] As previously reported, this type of solution-based NCs are prone to aggregationa nd lead to ar ough or discontinuous filmm orphology, which would further create an imperfect NiO/perovskite interface. The induced interfacial problems, such as poor contact at the HTL/perovskite interface or unsatisfactory interfacial chargek inetics interfered by defects, would significantly degradet he device performance.…”
Section: Introductionmentioning
confidence: 64%